The Thickness Measurement of Thin Films by Multiple Beam Interferometry

Journal of Applied Physics ◽

10.1063/1.1699770 ◽

1950 ◽

Vol 21 (9) ◽

pp. 843-846 ◽

Cited By ~ 73

Author(s):

G. D. Scott ◽

T. A. McLauchlan ◽

R. S. Sennett

Keyword(s):

Thin Films ◽

Thickness Measurement ◽

Multiple Beam ◽

Multiple Beam Interferometry

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The thickness measurement of thin films by multiple-beam interferometry

Vacuum ◽

10.1016/0042-207x(51)90071-1 ◽

1951 ◽

Vol 1 (2) ◽

pp. 142

Keyword(s):

Thin Films ◽

Thickness Measurement ◽

Multiple Beam ◽

Multiple Beam Interferometry

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Thickness measurements of thin films by multiple beam interferometry

Vacuum ◽

10.1016/0042-207x(54)90075-5 ◽

1954 ◽

Vol 4 (4) ◽

pp. 532

Keyword(s):

Thin Films ◽

Multiple Beam ◽

Thickness Measurements ◽

Multiple Beam Interferometry

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Thickness Measurement of Built-Up Monolayers by Multiple Beam Interferometry

Applied Optics ◽

10.1364/ao.12.000936 ◽

1973 ◽

Vol 12 (5) ◽

pp. 936 ◽

Cited By ~ 1

Author(s):

V. K. Srivastava

Keyword(s):

Thickness Measurement ◽

Multiple Beam ◽

Multiple Beam Interferometry

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Measurement of the Thickness of Thin Films by Multiple-Beam Interferometry

Proceedings of the Physical Society Section B ◽

10.1088/0370-1301/64/5/307 ◽

1951 ◽

Vol 64 (5) ◽

pp. 419-425 ◽

Cited By ~ 22

Author(s):

O S Heavens

Keyword(s):

Thin Films ◽

Multiple Beam ◽

Multiple Beam Interferometry

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Comment on: Thickness Measurement of Built-Up Monolayers by Multiple Beam Interferometry

Applied Optics ◽

10.1364/ao.12.0936_1 ◽

1973 ◽

Vol 12 (5) ◽

pp. 936_1

Author(s):

R. Shirahata ◽

G. D. Scott

Keyword(s):

Thickness Measurement ◽

Multiple Beam ◽

Multiple Beam Interferometry

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Influence of two-dimensional melting on multiple- beam interferometry reflection during the oxidation of aluminium thin films

Thin Solid Films ◽

10.1016/0040-6090(85)90152-x ◽

1985 ◽

Vol 131 (3-4) ◽

pp. 313-319

Author(s):

S. Lugomer ◽

M. Stipančić

Keyword(s):

Thin Films ◽

Two Dimensional ◽

Multiple Beam ◽

Multiple Beam Interferometry

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THICKNESS MEASUREMENTS OF THIN FILMS BY MULTIPLE-BEAM INTERFEROMETRY

10.2172/4364910 ◽

1954 ◽

Author(s):

T Bartlett ◽

F Ball

Keyword(s):

Thin Films ◽

Multiple Beam ◽

Thickness Measurements ◽

Multiple Beam Interferometry

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Some further applications of multiple. Beam interferometry I. interferometric method for measuring differential polarisation phase change at metallic reflection

Journal de Physique ◽

10.1051/jphysrad:01950001107043200 ◽

1950 ◽

Vol 11 (7) ◽

pp. 432-433

Author(s):

S. Tolansky

Keyword(s):

Phase Change ◽

Interferometric Method ◽

Multiple Beam ◽

Multiple Beam Interferometry

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Multiple-Beam Interferometry Applied to Oscillating Systems

Applied Optics ◽

10.1364/ao.4.000727 ◽

1965 ◽

Vol 4 (6) ◽

pp. 727 ◽

Cited By ~ 5

Author(s):

S. Tolansky

Keyword(s):

Multiple Beam ◽

Oscillating Systems ◽

Multiple Beam Interferometry

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Thin film thickness and refractive index measurement by multiple beam interferometry

10.1117/12.854796 ◽

2009 ◽

Author(s):

T. Y. Chen ◽

Y. J. Lin ◽

S. G. Hu ◽

S. L. Yang ◽

J. C. Chung

Keyword(s):

Thin Film ◽

Refractive Index ◽

Film Thickness ◽

Thin Film Thickness ◽

Refractive Index Measurement ◽

Multiple Beam ◽

Index Measurement ◽

Multiple Beam Interferometry

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