Statistical mechanics of polar systems: Dielectric constant for dipolar fluids

1974 ◽  
Vol 61 (2) ◽  
pp. 562-572 ◽  
Author(s):  
J. S. Ho/ye ◽  
G. Stell
Keyword(s):  
Dielectric Constant ◽  
Statistical Mechanics ◽  
Dipolar Fluids

scholarly journals Statistical mechanics approach to the electric polarization and dielectric constant of band insulators

2016 ◽  
Vol 94 (15) ◽  
Author(s):  
Frédéric Combes ◽  
Maximilian Trescher ◽  
Frédéric Piéchon ◽  
Jean-Noël Fuchs
Keyword(s):  
Dielectric Constant ◽  
Statistical Mechanics ◽  
Electric Polarization

Dielectric constant and sample's shape in dipolar fluids

2000 ◽  
Vol 10 (PR5) ◽  
pp. Pr5-437-Pr5-440
Author(s):  
A. Alastuey ◽  
V. Ballenegger
Keyword(s):  
Dielectric Constant ◽  
Dipolar Fluids

Article

1999 ◽  
Vol 77 (11) ◽  
pp. 1946-1950 ◽  
Author(s):  
A D Buckingham ◽  
Y Tantirungrotechai
Keyword(s):  
Dielectric Constant ◽  
Virial Coefficient ◽  
Intermolecular Forces ◽  
Shape Parameters ◽  
Dipolar Fluids

We report the second dielectric virial coefficient Bε of a nonpolarizable dipolar Gay-Berne fluid. The second dielectric virial coefficient is evaluated for several sets of shape parameters and temperature. The second dielectric virial coefficient for rodlike molecules is negative while it is large and positive for disklike molecules. It decreases to zero on increasing the temperature.Key words: dipolar fluids, dielectric constant, intermolecular forces, shape parameters.

Microstructural characterization of YBaCuO Films on LaAlO3 substrates

1989 ◽  
Vol 47 ◽  
pp. 180-181
Author(s):  
E. L. Hall ◽  
A. Mogro-Campero ◽  
N. Lewis ◽  
L. G. Turner
Keyword(s):  
Dielectric Constant ◽  
Single Crystal ◽  
Film Growth ◽  
Microstructural Characterization ◽  
Lattice Parameter ◽  
Film Plane ◽  
Substrate Material ◽  
High Loss ◽  
Amorphous Substrates ◽  
High Dielectric

There have been a large number of recent studies of the growth of Y-Ba-Cu-O thin films, and these studies have employed a variety of substrates and growth techniques. To date, the highest values of Tc and Jc have been found for films grown by sputtering or coevaporation on single-crystal SrTiO3 substrates, which produces a uniaxially-aligned film with the YBa2Cu3Ox c-axis normal to the film plane. Multilayer growth of films on the same substrate produces a triaxially-aligned film (regions of the film have their c-axis parallel to each of the three substrate <100> directions) with lower values of Jc. Growth of films on a variety of other polycrystalline or amorphous substrates produces randomly-oriented polycrystalline films with low Jc. Although single-crystal SrTiO3 thus produces the best results, this substrate material has a number of undesireable characteristics relative to electronic applications, including very high dielectric constant and a high loss tangent at microwave frequencies. Recently, Simon et al. have shown that LaAlO3 could be used as a substrate for YBaCuO film growth. This substrate is essentially a cubic perovskite with a lattice parameter of 0.3792nm (it has a slight rhombohedral distortion at room temperature) and this material exhibits much lower dielectric constant and microwave loss tangents than SrTiO3. It is also interesting from a film growth standpoint since it has a slightly smaller lattice parameter than YBa2Cu3Ox (a=0.382nm, b=c/3=0.389nm), while SrTiO3 is slightly larger (a=0.3905nm).

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