Computer simulation of dipolar fluids. Dependence of the dielectric constant on system size: A comparative study of Ewald sum and reaction field approaches

1986 ◽  
Vol 85 (3) ◽  
pp. 1502-1504 ◽  
Author(s):  
C. G. Gray ◽  
Y. S. Sainger ◽  
C. G. Joslin ◽  
P. T. Cummings ◽  
S. Goldman
Keyword(s):  
Computer Simulation ◽  
Dielectric Constant ◽  
Comparative Study ◽  
System Size ◽  
Reaction Field ◽  
Ewald Sum ◽  
Dipolar Fluids ◽  
Field Approaches

COMPARATIVE STUDY OF DIELECTRIC BEHAVIOR OF Mn0.4Zn0.6Fe2O4 NANOFERRITE BY CITRATE PRECURSOR METHOD

2008 ◽  
Vol 22 (16) ◽  
pp. 2537-2544 ◽  
Author(s):  
PREETI MATHUR ◽  
ATUL THAKUR ◽  
M. SINGH
Keyword(s):  
Particle Size ◽  
Dielectric Constant ◽  
Comparative Study ◽  
Average Particle Size ◽  
Dielectric Behavior ◽  
Average Particle ◽  
Oxidizing Agent ◽  
Precursor Method ◽  
Citrate Precursor ◽  
Citrate Precursor Method

In the present work, comparative study of the dielectric behavior of Mn 0.4 Zn 0.6 Fe 2 O 4 ferrite synthesized with and without H 2 O 2 (hydrogen peroxide) has been presented. The dc resistivity has been improved by the citrate precursor method as compared to the ceramic method, and it is further improved by the addition of H 2 O 2, which acts as a strong oxidizing agent. We have shown by means of X-ray diffraction that the resulting ferrite is made up of nanocrystallites and the average size of these nanocrystallites–calculated by Scherrer's formula–depends on the polarizer. The average particle size was found to be ~70 nm with H 2 O 2 and ~88 nm without H 2 O 2. The particle size is further confirmed by scanning electron microscopy. Both the results are found to be in good agreement. The decrease in dielectric constant and dielectric loss factor by addition of oxidizing agent is justified by inverse proportionality between the resistivity and dielectric constant. Possible mechanisms contributing to these processes have been discussed.

Concerning the role of the reaction field in the proton shielding of molecules in solution

1967 ◽  
Vol 45 (10) ◽  
pp. 1093-1096 ◽  
Author(s):  
G. Kotowycz ◽  
T. Schaefer
Keyword(s):  
Dielectric Constant ◽  
Chemical Shift ◽  
Solute Molecule ◽  
Proton Chemical Shift ◽  
Square Root ◽  
Reaction Field ◽  
Strong Curvature

It is shown that the strong curvature in some plots of proton chemical shift σ versus the Onsager reaction field E can be removed by plotting the shifts of the solute molecule versus the square root of the dielectric constant of the medium. The resulting values of k in the equation σ = −kE cos θ are fairly consistent and reasonable in magnitude.

Comparative Study of TACS/DBM and MODELS of ATP-EMTP Applied to Power Systems Computer Simulation

2016 ◽  
Vol 14 (2) ◽  
pp. 704-712 ◽  
Author(s):  
M. A. Tamashiro ◽  
G. C. Guimaraes ◽  
A. R. Rodrigues ◽  
R. V. A. Monteiro ◽  
T. L. Oliveira ◽  
...  
Keyword(s):  
Computer Simulation ◽  
Power Systems ◽  
Comparative Study
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