On the Electronic Structure of Some Nitrogen‐Containing Molecules as Studied by Ab Initio SCF MO Calculations and High‐Energy Electron Spectroscopy

J. F. Wyatt; I. H. Hillier; V. R. Saunders; J. A. Connor; M. Barber

doi:10.1063/1.1674829

On the Electronic Structure of Some Nitrogen‐Containing Molecules as Studied by Ab Initio SCF MO Calculations and High‐Energy Electron Spectroscopy

The Journal of Chemical Physics ◽

10.1063/1.1674829 ◽

1971 ◽

Vol 54 (12) ◽

pp. 5311-5315 ◽

Cited By ~ 63

Author(s):

J. F. Wyatt ◽

I. H. Hillier ◽

V. R. Saunders ◽

J. A. Connor ◽

M. Barber

Keyword(s):

Electronic Structure ◽

Ab Initio ◽

Electron Spectroscopy ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Mo Calculations

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Nitridation of GaAs(001) surface: Auger electron spectroscopy and reflection high-energy electron diffraction

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.590784 ◽

1999 ◽

Vol 17 (4) ◽

pp. 1525 ◽

Cited By ~ 16

Author(s):

Igor Aksenov ◽

Hidekazu Iwai ◽

Yoshinobu Nakada ◽

Hajime Okumura

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

High Energy ◽

Energy Electron ◽

High Energy Electron

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High-Energy Electron Diffraction and Auger Electron Spectroscopy Study of Silicon Epitaxy by Silane Pyrolysis

Journal of Vacuum Science and Technology ◽

10.1116/1.1316543 ◽

1972 ◽

Vol 9 (1) ◽

pp. 164-164

Author(s):

R. C. Henderson ◽

R. F. Helm

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

High Energy ◽

Energy Electron ◽

Spectroscopy Study ◽

High Energy Electron ◽

Silicon Epitaxy

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A high-energy electron scattering study of the electronic structure and elemental composition of O-implanted Ta films used for the fabrication of memristor devices

Journal of Applied Physics ◽

10.1063/1.4818524 ◽

2013 ◽

Vol 114 (7) ◽

pp. 073508 ◽

Cited By ~ 11

Author(s):

M. Vos ◽

P. L. Grande ◽

S. K. Nandi ◽

D. K. Venkatachalam ◽

R. G. Elliman

Keyword(s):

Electronic Structure ◽

Elemental Composition ◽

Electron Scattering ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Scattering Study

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Silicon Cleaning with Hydrogen Peroxide Solutions: A High Energy Electron Diffraction and Auger Electron Spectroscopy Study

Journal of The Electrochemical Society ◽

10.1149/1.2404325 ◽

1972 ◽

Vol 119 (6) ◽

pp. 772 ◽

Cited By ~ 202

Author(s):

R. C. Henderson

Keyword(s):

Hydrogen Peroxide ◽

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

High Energy ◽

Energy Electron ◽

Spectroscopy Study ◽

High Energy Electron

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In situ observation of growing surface of oxide films by reflection high‐energy electron diffraction beam excited Auger electron spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578625 ◽

1993 ◽

Vol 11 (5) ◽

pp. 2676-2680 ◽

Cited By ~ 3

Author(s):

Hidehiko Nonaka ◽

Takashi Shimizu ◽

Shingo Ichimura ◽

Kazuo Arai

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Oxide Films ◽

High Energy ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron

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Electronic Structure of Perovskite Oxides, LaMO3 (M = Ti-Ni), from High-Energy Electron Spectroscopic Investigations

Journal of Solid State Chemistry ◽

10.1006/jssc.1994.1219 ◽

1994 ◽

Vol 111 (1) ◽

pp. 208-216 ◽

Cited By ~ 31

Author(s):

D.D. Sarma ◽

A. Chainani

Keyword(s):

Electronic Structure ◽

High Energy ◽

Perovskite Oxides ◽

Energy Electron ◽

High Energy Electron ◽

Spectroscopic Investigations

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Electronic structure of unoccupied states of stoichiometric ZrN, NbC and NbN As determined by high energy electron energy loss spectroscopy

Solid State Communications ◽

10.1016/0038-1098(85)90231-5 ◽

1985 ◽

Vol 55 (8) ◽

pp. 675-677 ◽

Cited By ~ 32

Author(s):

J. Pflüger ◽

J. Fink ◽

K. Schwarz

Keyword(s):

Electronic Structure ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Electron Energy Loss

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Characterization of surface structure. Reflection high energy electron diffraction-Auger electron spectroscopy (RHEED-AES method).

Nihon Kessho Gakkaishi ◽

10.5940/jcrsj.29.152 ◽

1987 ◽

Vol 29 (2) ◽

pp. 152-153 ◽

Cited By ~ 1

Author(s):

AYAHIKO ICHIMIYA

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Surface Structure ◽

Electron Spectroscopy ◽

Auger Electron ◽

High Energy ◽

Energy Electron ◽

High Energy Electron

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Observation of dimer dangling bonds on a Si(001)2×1 surface by grazing-incidence reflection high energy electron diffraction and Auger electron spectroscopy

Applied Surface Science ◽

10.1016/s0169-4332(98)00037-3 ◽

1998 ◽

Vol 130-132 ◽

pp. 123-127

Author(s):

Fumikazu Shimoshikiryo ◽

Yuji Takakuwa ◽

Nobuo Miyamoto

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Grazing Incidence ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Dangling Bonds

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INVITED PAPER: INTERPRETATION OF HIGH-ENERGY ELECTRON SPECTROSCOPY IN f-SYSTEMS BEYOND THE ATOMIC-LIKE APPROACH

Anomalous Rare Earths and Actinides ◽

10.1016/b978-1-4832-2948-5.50148-9 ◽

1987 ◽

pp. 503-508

Author(s):

Y. BAER ◽

F. PATTHEY ◽

W.-D. SCHNEIDER ◽

B. DELLEY

Keyword(s):

Electron Spectroscopy ◽

High Energy ◽

Energy Electron ◽

High Energy Electron

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