High‐Temperature Defect Structure and Electrical Properties of NiO

1968 ◽  
Vol 49 (3) ◽  
pp. 1243-1249 ◽  
Author(s):  
I. Bransky ◽  
N. M. Tallan
Keyword(s):  
High Temperature ◽  
Electrical Properties ◽  
Defect Structure

Study of the electrical properties of  Cz p-type solar-grade silicon wafers against the high-temperature processes

2021 ◽  
Vol 127 (6) ◽  
Author(s):  
Mohamed Maoudj ◽  
Djoudi Bouhafs ◽  
Nacer Eddine Bourouba ◽  
Abdelhak Hamida-Ferhat ◽  
Abdelkader El Amrani
Keyword(s):  
High Temperature ◽  
Electrical Properties ◽  
Silicon Wafers ◽  
Solar Grade Silicon ◽  
High Temperature Processes ◽  
Grade Silicon ◽  
P Type

Polyimide Copolymers Containing Various Levels Of The 6F Moiety For High Temperature And Microelectronic Applications

1991 ◽  
Vol 227 ◽  
Author(s):  
M. Haider ◽  
E. Chenevey ◽  
R. H. Vora ◽  
W. Cooper ◽  
M. Glick ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
High Temperature ◽  
Electrical Properties ◽  
Oxidative Stability ◽  
Trifluoromethyl Group ◽  
Thermal And Mechanical Properties

ABSTRACTTrifluoromethyl group-containing polyimides not only show extraordinary electrical properties, but they also exhibit excellent long-term thermo-oxidative stability. Among the most thermomechanically stable structural polyimides are those from 6F dianhydride (6FDA) and 6F diamines. The effects of substituting non-fluorine containing monomers such as BTDA, mPDA and 4,4′-DADPS for the hexafluoroisopropylidene monomers on the dielectric, thermo-oxidative, thermal and mechanical properties of the copolymers were studied.

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