Evidence of the polar Kerr effect in magnetic thin films with head‐on domains

1973 ◽  
Vol 23 (8) ◽  
pp. 483-484 ◽  
Author(s):  
E. J. Hsieh ◽  
H. H. Chau
1993 ◽  
Vol 308 ◽  
Author(s):  
H.E. Inglefield ◽  
C.A. Ballentine ◽  
G. Bochi ◽  
S.S. Bogomolov ◽  
R.C. O'Handley ◽  
...  

ABSTRACTWe have detected magnetic transitions in Ni/Cu (100) films as a function of Ni thickness through in situ measurements of the magneto-optic Kerr effect (MOKE). Crystalline quality was monitored using in situ RHEED and Auger electron spectroscopy. Films were deposited by molecular beam epitaxy on silicon wafers and cleaved sodium chloride with varying epitaxial Ni layer thicknesses between 10 and 200 A. High-resolution TEM images of these films indicate decreasing misfit dislocation spacing and decreasing strain as measured by moiré fringe analysis with increasing Ni thickness. These observations have been correlated with changes in magnetic anisotropy as measured by MOKE. MOKE, therefore, may provide a tool for in situ monitoring of the kinetics of misfit accommodation in magnetic thin films.


Author(s):  
L. Tang ◽  
G. Thomas ◽  
M. R. Khan ◽  
S. L. Duan

Cr thin films are often used as underlayers for Co alloy magnetic thin films, such as Co1, CoNi2, and CoNiCr3, for high density longitudinal magnetic recording. It is belived that the role of the Cr underlayer is to control the growth and texture of the Co alloy magnetic thin films, and, then, to increase the in plane coercivity of the films. Although many epitaxial relationship between the Cr underlayer and the magnetic films, such as ﹛1010﹜Co/ {110﹜Cr4, ﹛2110﹜Co/ ﹛001﹜Cr5, ﹛0002﹜Co/﹛110﹜Cr6, have been suggested and appear to be related to the Cr thickness, the texture of the Cr underlayer itself is still not understood very well. In this study, the texture of a 2000 Å thick Cr underlayer on Nip/Al substrate for thin films of (Co75Ni25)1-xTix dc-sputtered with - 200 V substrate bias is investigated by electron microscopy.


2008 ◽  
Vol 42 (2) ◽  
pp. 125-128
Author(s):  
J. F. Al-Sharab ◽  
J. E. Wittig ◽  
G. Bertero ◽  
T. Yamashita ◽  
J. Bentley ◽  
...  

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  

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