Determination of deep‐level energy and density profiles in inhomogeneous semiconductors

G. Goto; S. Yanagisawa; O. Wada; H. Takanashi

doi:10.1063/1.1654839

Determination of deep‐level energy and density profiles in inhomogeneous semiconductors

Applied Physics Letters ◽

10.1063/1.1654839 ◽

1973 ◽

Vol 23 (3) ◽

pp. 150-151 ◽

Cited By ~ 43

Author(s):

G. Goto ◽

S. Yanagisawa ◽

O. Wada ◽

H. Takanashi

Keyword(s):

Deep Level ◽

Level Energy ◽

Density Profiles

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Deep level energy states in porous silicon and porous silicon carbide determined by space-charge-limited current measurements

Applied Surface Science ◽

10.1016/s0169-4332(98)00700-4 ◽

1999 ◽

Vol 142 (1-4) ◽

pp. 569-573 ◽

Cited By ~ 9

Author(s):

Takahiro Matsumoto ◽

Hidenori Mimura ◽

Nobuyoshi Koshida ◽

Yasuaki Masumoto

Keyword(s):

Silicon Carbide ◽

Porous Silicon ◽

Space Charge ◽

Deep Level ◽

Level Energy ◽

Space Charge Limited Current ◽

Porous Silicon Carbide ◽

Limited Current ◽

Energy States ◽

Space Charge Limited

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Determination of Internal Density Profiles of Smart Acrylamide-Based Microgels by Small-Angle Neutron Scattering: A Multishell Reverse Monte Carlo Approach

Langmuir ◽

10.1021/acs.langmuir.8b03217 ◽

2018 ◽

Vol 34 (50) ◽

pp. 15403-15415 ◽

Cited By ~ 15

Author(s):

Marian Cors ◽

Lars Wiehemeier ◽

Yvonne Hertle ◽

Artem Feoktystov ◽

Fabrice Cousin ◽

...

Keyword(s):

Monte Carlo ◽

Neutron Scattering ◽

Small Angle ◽

Small Angle Neutron Scattering ◽

Reverse Monte Carlo ◽

Density Profiles ◽

Monte Carlo Approach

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Deep‐level energy spectroscopy inp‐type CdTe using TSC measurements

Journal of Applied Physics ◽

10.1063/1.322310 ◽

1976 ◽

Vol 47 (1) ◽

pp. 264-266 ◽

Cited By ~ 18

Author(s):

G. M. Martin ◽

E. Fogarassy ◽

E. Fabre

Keyword(s):

Deep Level ◽

Level Energy

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Differential methods for determination of deep-level parameters from recombination currents of p-n junctions

Semiconductors ◽

10.1134/1.1187567 ◽

1998 ◽

Vol 32 (10) ◽

pp. 1065-1068 ◽

Cited By ~ 2

Author(s):

S. V. Bulyarskii ◽

N. S. Grushko ◽

A. V. Lakalin

Keyword(s):

Deep Level ◽

Differential Methods

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Determination of D-Region Electron Loss Rates and Electron Density Profiles from VLF Measurements During Solar Flare X-Ray Events

ELF-VLF Radio Wave Propagation ◽

10.1007/978-94-010-2265-1_16 ◽

1974 ◽

pp. 193-197 ◽

Cited By ~ 1

Author(s):

G. Bjøntegaard

Keyword(s):

Solar Flare ◽

Electron Density ◽

Electron Loss ◽

Density Profiles ◽

X Ray ◽

D Region ◽

Electron Density Profiles ◽

Loss Rates

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Determination of deep-level parameters by isothermal deep-level transient spectroscopy with optical excitation

phys stat sol (a) ◽

10.1002/pssa.2211380122 ◽

1993 ◽

Vol 138 (1) ◽

pp. 241-248 ◽

Cited By ~ 4

Author(s):

Ľ. Stuchlíková ◽

L. Harmatha ◽

V. Nágl ◽

M. Gaži

Keyword(s):

Deep Level Transient Spectroscopy ◽

Deep Level ◽

Optical Excitation ◽

Transient Spectroscopy

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Microwave Determination of Plasma Density Profiles

Journal of Applied Physics ◽

10.1063/1.1735587 ◽

1960 ◽

Vol 31 (2) ◽

pp. 428-430 ◽

Cited By ~ 27

Author(s):

Charles B. Wharton ◽

Donald M. Slager

Keyword(s):

Plasma Density ◽

Density Profiles

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Determination of the solvent density profiles across mesopores of silica-C18 bonded phases in contact with acetonitrile/water mixtures: A semi-empirical approach

Journal of Chromatography A ◽

10.1016/j.chroma.2015.07.073 ◽

2015 ◽

Vol 1410 ◽

pp. 90-98 ◽

Cited By ~ 14

Author(s):

Fabrice Gritti

Keyword(s):

Empirical Approach ◽

Density Profiles ◽

Bonded Phases ◽

Solvent Density ◽

Semi Empirical

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Isothermal Capacitance Transient Spectroscopy for Determination of Deep Level Parameters

Japanese Journal of Applied Physics ◽

10.1143/jjap.19.l335 ◽

1980 ◽

Vol 19 (6) ◽

pp. L335-L338 ◽

Cited By ~ 107

Author(s):

Hideyo Okushi ◽

Yozo Tokumaru

Keyword(s):

Deep Level ◽

Transient Spectroscopy ◽

Capacitance Transient ◽

Isothermal Capacitance Transient Spectroscopy

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Determination of bandgap states in p-type In0.49Ga0.51P grown on SiGe/Si and GaAs by deep level optical spectroscopy and deep level transient spectroscopy

Journal of Applied Physics ◽

10.1063/1.3559739 ◽

2011 ◽

Vol 109 (6) ◽

pp. 063709 ◽

Cited By ~ 6

Author(s):

M. González ◽

A. M. Carlin ◽

C. L. Dohrman ◽

E. A. Fitzgerald ◽

S. A. Ringel

Keyword(s):

Optical Spectroscopy ◽

Deep Level Transient Spectroscopy ◽

Deep Level ◽

Transient Spectroscopy ◽

P Type

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