Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

2004 ◽  
Vol 75 (3) ◽  
pp. 689-693 ◽  
Author(s):  
Roel Kassies ◽  
Kees O. van der Werf ◽  
Martin L. Bennink ◽  
Cees Otto
Keyword(s):  
Atomic Force Microscopy ◽  
High Frequency ◽  
Optical Feedback ◽  
Current Modulation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Frequency Laser

scholarly journals Self-driving capacitive cantilevers for high-frequency atomic force microscopy

2012 ◽  
Vol 100 (5) ◽  
pp. 053110 ◽  
Author(s):  
Keith A. Brown ◽  
Benjamin H. Yang ◽  
R. M. Westervelt
Keyword(s):  
Atomic Force Microscopy ◽  
High Frequency ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Electrothermally driven high-frequency piezoresistive SiC cantilevers for dynamic atomic force microscopy

2014 ◽  
Vol 116 (5) ◽  
pp. 054304 ◽  
Author(s):  
R. Boubekri ◽  
E. Cambril ◽  
L. Couraud ◽  
L. Bernardi ◽  
A. Madouri ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Frequency ◽  
Force Microscopy ◽  
Atomic Force

High-Frequency Low Amplitude Atomic Force Microscopy

2009 ◽  
pp. 347-360
Author(s):  
Hideki Kawakatsu ◽  
Shuhei Nishida ◽  
Dai Kobayashi ◽  
Kazuhisa Nakagawa ◽  
Shigeki Kawai
Keyword(s):  
Atomic Force Microscopy ◽  
High Frequency ◽  
Force Microscopy ◽  
Atomic Force ◽  
Low Amplitude

scholarly journals High-frequency multimodal atomic force microscopy

2014 ◽  
Vol 5 ◽  
pp. 2459-2467 ◽  
Author(s):  
Adrian P Nievergelt ◽  
Jonathan D Adams ◽  
Pascal D Odermatt ◽  
Georg E Fantner
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
High Frequency ◽  
High Speed ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Topography ◽  
Atomic Force Microscopy Imaging ◽  
Speed Method

Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenient, high-speed method for obtaining nanoscale topography as well as mechanical properties. Nevertheless, instrument bandwidth limitations on cantilever excitation and readout have restricted the ability of multifrequency techniques to fully benefit from small cantilevers. We present an approach for cantilever excitation and deflection readout with a bandwidth of 20 MHz, enabling multifrequency techniques extended beyond 2 MHz for obtaining materials contrast in liquid and air, as well as soft imaging of delicate biological samples.

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