Slotted-plate apparatus to measure yield stress of suspensions

2004 ◽  
Vol 75 (3) ◽  
pp. 737-740 ◽  
Author(s):  
L. Zhu ◽  
K. D. Papadopoulos ◽  
D. De Kee
Author(s):  
D. De Kee ◽  
L. Zhu

We will discuss a new slotted-plate device to directly measure static yield stresses of complex multiphase systems. Possible wall effects associated with our earlier yield-stress plate instrument have been minimized. Our new setup avoids the disadvantages of the vane instrument. Yield stress values on a variety of systems have been obtained and have been compared with the values obtained via a variety of other methods.


2001 ◽  
Vol 45 (5) ◽  
pp. 1105-1122 ◽  
Author(s):  
Lixuan Zhu ◽  
Ning Sun ◽  
Kyriakos Papadopoulos ◽  
Daniel De Kee

2016 ◽  
Vol 94 (8) ◽  
pp. 1442-1447 ◽  
Author(s):  
Daniel De Kee ◽  
David Rice ◽  
Cindy Leissinger ◽  
Bin Meng
Keyword(s):  

Author(s):  
Gabriel Souza ◽  
Luís Felipe dos Santos Carollo ◽  
Sandro Metrevelle Marcondes de Lima e Silva

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