Slotted-Plate Device To Measure the Yield Stress of Suspensions: Finite Element Analysis

2002 ◽  
Vol 41 (25) ◽  
pp. 6375-6382 ◽  
Author(s):  
Lixuan Zhu ◽  
Daniel De Kee
2018 ◽  
Vol 777 ◽  
pp. 457-461
Author(s):  
Ya Jun Wang ◽  
Xiao Ping Fan ◽  
Hong Xiang ◽  
Fang Ying Wu ◽  
Zhuo Jiang

The solid modeling method for Expandable Polyethylene (EPE) and honeycomb paperboard combination structure was studied. The static compression of the structure was simulated by finite element method (FEM). The effect of the thickness of the EPE on the structure was analyzed, and the stress distribution and deformation characteristics were obtained. The results showed that the thickness of EPE had no significant effect on the yield stress of the structure, but the corresponding strain was increased with the increase of the thickness of EPE. The EPE could protect honeycomb paperboard from damage. The results of finite element analysis were in good agreement with the experimental results.


2012 ◽  
Vol 625 ◽  
pp. 312-317 ◽  
Author(s):  
Guang Feng Shi ◽  
Guo Quan Shi ◽  
Lin Sen Song ◽  
Zhi Wei Xu

For the research on elastic-plastic deformation characteristics of the echelle grating in the mechanical ruling depth range, a series of nanoindentation tests are completed about the deposited Al film of available echelle grating with a Berkovich indenter on a CSM nanoindentation instrument. Then a finite element analysis of the nanoindentation process is studied with an orthogonal experiment method for a series of given parameters containing the yield stress and strain-hardening exponent. The optimum combinations of yield stress and strain-hardening exponent are 200MPa and 0.1, which are got by the objective of the least absolute value of maximum loads deviation between the indentation test and the finite element analysis. Finally the elastic-plastic stress-strain curve of power function of the Al film is represented with the difference analysis from the orthogonal simulations.


2000 ◽  
Vol 41 (10) ◽  
pp. 1356-1359 ◽  
Author(s):  
Mychailo B. Toloczko ◽  
Katsunori Abe ◽  
Margaret L. Hamilton ◽  
Frank A. Garner ◽  
Richard J. Kurtz

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