Characterization of InP electron-initiated impact ionization in low electric fields using abrupt junction NpN InP/GaAsSb/InP double heterojunction bipolar transistors
1994 ◽
Vol 41
(8)
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pp. 1319-1326
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2001 ◽
Vol 17
(1)
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pp. 87-92
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2003 ◽
Vol 19
(3)
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pp. 404-407
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