Formation and electric property measurement of nanosized patterns of tantalum oxide by current sensing atomic force microscope
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2019 ◽
Vol 11
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pp. 645-650
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2009 ◽
Vol 9
(9)
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pp. 5467-5470
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2014 ◽
Vol 716
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pp. 158-163
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1992 ◽
Vol 50
(2)
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pp. 1146-1147
1989 ◽
Vol 47
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pp. 32-33