Formation of Nanopatterns of a Self-Assembled Monolayer (SAM) within a SAM of Different Molecules Using a Current Sensing Atomic Force Microscope

Nano Letters ◽  
2002 ◽  
Vol 2 (2) ◽  
pp. 137-140 ◽  
Author(s):  
Jianwei Zhao ◽  
Kohei Uosaki
Keyword(s):  
Atomic Force Microscope ◽  
Self Assembled Monolayer ◽  
Current Sensing ◽  
Atomic Force ◽  
Self Assembled ◽  
A Current

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

Measurements of Single-Molecule Bond-Rupture Forces between Self-Assembled Monolayers of Organosilanes with the Atomic Force Microscope

Langmuir ◽  
1997 ◽  
Vol 13 (14) ◽  
pp. 3761-3768 ◽  
Author(s):  
L. A. Wenzler ◽  
G. L. Moyes ◽  
G. N. Raikar ◽  
R. L. Hansen ◽  
J. M. Harris ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Single Molecule ◽  
Self Assembled Monolayers ◽  
Bond Rupture ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled

Adhesion and Friction at Graphene/Self-Assembled Monolayer Interfaces Investigated by Atomic Force Microscopy

2017 ◽  
Vol 121 (10) ◽  
pp. 5635-5641 ◽  
Author(s):  
Meagan B. Elinski ◽  
Benjamin D. Menard ◽  
Zhuotong Liu ◽  
James D. Batteas
Keyword(s):  
Atomic Force Microscopy ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled
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