Compensation of cross talk in the optical lever deflection method used in atomic force microscopy

Satoru Fujisawa; Hisato Ogiso

doi:10.1063/1.1622972

Compensation of cross talk in the optical lever deflection method used in atomic force microscopy

Review of Scientific Instruments ◽

10.1063/1.1622972 ◽

2003 ◽

Vol 74 (12) ◽

pp. 5115-5117 ◽

Cited By ~ 10

Author(s):

Satoru Fujisawa ◽

Hisato Ogiso

Keyword(s):

Atomic Force Microscopy ◽

Cross Talk ◽

Force Microscopy ◽

Atomic Force ◽

Optical Lever

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Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy

Review of Scientific Instruments ◽

10.1063/1.2800783 ◽

2007 ◽

Vol 78 (10) ◽

pp. 103706 ◽

Cited By ~ 9

Author(s):

Ajit C. Shegaonkar ◽

Srinivasa M. Salapaka

Keyword(s):

Atomic Force Microscopy ◽

Cross Talk ◽

Force Microscopy ◽

Atomic Force ◽

Imaging Artifacts

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Enhancing the optical lever sensitivity of microcantilevers for dynamic atomic force microscopy via integrated low frequency paddles

Nanotechnology ◽

10.1088/0957-4484/27/19/195502 ◽

2016 ◽

Vol 27 (19) ◽

pp. 195502 ◽

Cited By ~ 3

Author(s):

Nurul Huda Shaik ◽

Ronald G Reifenberger ◽

Arvind Raman

Keyword(s):

Atomic Force Microscopy ◽

Low Frequency ◽

Force Microscopy ◽

Atomic Force ◽

Optical Lever

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Three-dimensional beam tracking for optical lever detection in atomic force microscopy

Review of Scientific Instruments ◽

10.1063/1.1150175 ◽

2000 ◽

Vol 71 (1) ◽

pp. 137-141 ◽

Cited By ~ 7

Author(s):

Katsushi Nakano

Keyword(s):

Atomic Force Microscopy ◽

Three Dimensional ◽

Force Microscopy ◽

Atomic Force ◽

Beam Tracking ◽

Optical Lever

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How to measure forces with atomic force microscopy without significant influence from nonlinear optical lever sensitivity

Review of Scientific Instruments ◽

10.1063/1.3194048 ◽

2009 ◽

Vol 80 (9) ◽

pp. 093701 ◽

Cited By ~ 46

Author(s):

Esben Thormann ◽

Torbjön Pettersson ◽

Per M. Claesson

Keyword(s):

Atomic Force Microscopy ◽

Significant Influence ◽

Nonlinear Optical ◽

Force Microscopy ◽

Atomic Force ◽

Optical Lever

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Cross-talk compensation in atomic force microscopy

Review of Scientific Instruments ◽

10.1063/1.3002483 ◽

2008 ◽

Vol 79 (10) ◽

pp. 103706 ◽

Cited By ~ 14

Author(s):

Cagdas D. Onal ◽

Bilsay Sümer ◽

Metin Sitti

Keyword(s):

Atomic Force Microscopy ◽

Cross Talk ◽

Force Microscopy ◽

Atomic Force

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Optical lever detection in higher eigenmode dynamic atomic force microscopy

Review of Scientific Instruments ◽

10.1063/1.1808058 ◽

2004 ◽

Vol 75 (11) ◽

pp. 5053-5055 ◽

Cited By ~ 40

Author(s):

Robert W. Stark

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Optical Lever

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104 The Development of Atomic Force Microscopy (AFM) Using a "Van der Pol" Type Self-excitation for Prove-Cantilever : 3rd Report: A prototype AFM using optical lever method

The Proceedings of the Dynamics & Design Conference ◽

10.1299/jsmedmc.2006._104-1_ ◽

2006 ◽

Vol 2006 (0) ◽

pp. _104-1_-_104-4_

Author(s):

Keiichi HAYASHI ◽

Kiwamu ASHIDA ◽

Masaharu KURODA ◽

Hiroshi YABUNO

Keyword(s):

Atomic Force Microscopy ◽

Van Der Pol ◽

Force Microscopy ◽

Atomic Force ◽

Optical Lever

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Flexural sensitivity of high resonant atomic force microscopy cantilever based on optical lever detection

Proceedings of the Institution of Mechanical Engineers Part N Journal of Nanomaterials Nanoengineering and Nanosystems ◽

10.1177/1740349914533956 ◽

2014 ◽

Vol 230 (2) ◽

pp. 76-80 ◽

Cited By ~ 1

Author(s):

Zhao Yang ◽

Huang Qiangxian ◽

Yuan Dan ◽

Hu Xiaojuan ◽

Cheng Zhenying

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Optical Lever ◽

Atomic Force Microscopy Cantilever

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An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

Review of Scientific Instruments ◽

10.1063/1.3459886 ◽

2010 ◽

Vol 81 (7) ◽

pp. 073711 ◽

Cited By ~ 10

Author(s):

Christopher J. Tourek ◽

Sriram Sundararajan

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Alternative Method ◽

Optical Lever

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Coupling effects of refractive index discontinuity, spot size and spot location on the deflection sensitivity of optical-lever based atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/19/23/235501 ◽

2008 ◽

Vol 19 (23) ◽

pp. 235501 ◽

Cited By ~ 4

Author(s):

Yu Liu ◽

Jun Yang

Keyword(s):

Atomic Force Microscopy ◽

Refractive Index ◽

Spot Size ◽

Coupling Effects ◽

Force Microscopy ◽

Atomic Force ◽

Optical Lever

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