scholarly journals An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

2010 ◽  
Vol 81 (7) ◽  
pp. 073711 ◽  
Author(s):  
Christopher J. Tourek ◽  
Sriram Sundararajan
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Alternative Method ◽  
Optical Lever

Alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy

1999 ◽  
Vol 75 (24) ◽  
pp. 3883-3885 ◽  
Author(s):  
S. P. Jarvis ◽  
H. Tokumoto ◽  
H. Yamada ◽  
K. Kobayashi ◽  
A. Toda
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lateral Forces ◽  
Alternative Method

Metasurface-enhanced optical lever sensitivity for atomic force microscopy

2019 ◽  
Vol 30 (36) ◽  
pp. 365501 ◽  
Author(s):  
Zan Yao ◽  
Xicheng Xia ◽  
Yaoping Hou ◽  
Peng Zhang ◽  
Xiaomin Zhai ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Optical Lever

scholarly journals Noninvasive determination of optical lever sensitivity in atomic force microscopy

2006 ◽  
Vol 77 (1) ◽  
pp. 013701 ◽  
Author(s):  
M. J. Higgins ◽  
R. Proksch ◽  
J. E. Sader ◽  
M. Polcik ◽  
S. Mc Endoo ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Optical Lever
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