Growth of high-ksilicon oxynitride thin films by means of a pulsed laser deposition-atomic nitrogen plasma source hybrid system for gate dielectric applications

2003 ◽  
Vol 94 (9) ◽  
pp. 5969-5975 ◽  
Author(s):  
E. Desbiens ◽  
M. A. El Khakani
1999 ◽  
Vol 593 ◽  
Author(s):  
T. Thärigen ◽  
V. Riede ◽  
G. Lippold ◽  
E. Hartmann ◽  
R. Hesse ◽  
...  

ABSTRACTCarbon silicon nitride (CSixNy), and carbon boron nitride (CBxNy) thin films have been grown by pulsed laser deposition (PLD) of various carbon (silicon/boron) (nitride) targets using an additional nitrogen RF plasma source on [100] oriented silicon substrates without additional heating. The CSixNy and CBxNy thin films were amorphous and showed nano hardness up to 23 GPa compared to 14 GPa for silicon and maximum nitrogen content of 30 at%. The maximum nanohardness was achieved for 10% Si and 10% B content in the films. The lower hardness of this films compared to the nanohardness of 30-50 GPa of DLC films indicates a lower amount of covalent carbon-nitrogen bonding in the films. However, in contrast to DLC films, the CSixNy and CBxNy films can be grown to thickness above 3 μm due to lower internal compressive stress. XPS of CSixNy and CBxNy film surfaces shows clear correlation of binding energy and intensity of N ls, C ls, and Si 2p peaks to composition of the PLD-targets and to nitrogen flow through plasma source, indicating soft changes of binding structure due to variation of PLD parameters. The results demonstrate the capability of the plasma assisted PLD process to deposit hard amorphous CSixNy, and CBxNy thin films with adjustable properties.


1996 ◽  
Vol 423 ◽  
Author(s):  
T. Ogawa ◽  
M. Okamoto ◽  
Y. Mori ◽  
T. Sasaki

AbstractWe have grown highly oriented aluminum nitride (AIN) thin films on Si (100) substrates by using pulsed laser deposition from sintering AIN targets. Three different growth environments, vacuum, nitrogen gas, and nitrogen plasma, have been used in order to investigate the effect of the ambient on the film quality. Rutherford backscattering spectrometry suggests that the N/Al ratio increases when the AIN film is grown in a nitrogen-contained ambient. Cathodoluminescence study implies the decrease of oxygen content in the film grown in a nitrogen plasma ambient.


1997 ◽  
Vol 6 (8) ◽  
pp. 1015-1018 ◽  
Author(s):  
Tetsuya Ogawa ◽  
Mitsuo Okamoto ◽  
Yap Yoke Khin ◽  
Yusuke Mori ◽  
Akimitsu Hatta ◽  
...  

2002 ◽  
Vol 236 (1-3) ◽  
pp. 5-9 ◽  
Author(s):  
P Bhattacharya ◽  
T.K Sharma ◽  
S Singh ◽  
A Ingale ◽  
L.M Kukreja

2004 ◽  
Vol 80 (8) ◽  
pp. 1775-1779 ◽  
Author(s):  
J.-M. Liu ◽  
G.H. Shi ◽  
L.C. Yu ◽  
T.L. Li ◽  
Z.G. Liu ◽  
...  

2013 ◽  
Vol 14 (1) ◽  
pp. 87-90 ◽  
Author(s):  
Daichi Oka ◽  
Yasushi Hirose ◽  
Tomoteru Fukumura ◽  
Tetsuya Hasegawa

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