Spin-polarized scanning tunneling microscope for imaging the in-plane magnetization

2003 ◽  
Vol 83 (10) ◽  
pp. 2016-2018 ◽  
Author(s):  
U. Schlickum ◽  
W. Wulfhekel ◽  
J. Kirschner
1991 ◽  
Vol 231 ◽  
Author(s):  
R. Wiesendanger ◽  
D. Buergler ◽  
G. Tarrach ◽  
I.V. Shvets ◽  
H.-J. Guentherodt

AbstractWe report on a novel promising technique for the investigation of magnetic structures at surfaces at high spatial resolution, ultimately down to the atomic scale. This technique is based on the observation of vacuum tunneling of spin-polarized electrons by means of a scanning tunneling microscope (STM). We discuss appropriate probe tips for the spin-polarized STM (SPSTM) and describe initial experimental results. We further focus on the information obtained by SPSTM. Finally, the perspectives of SPSTM will be discussed.


1997 ◽  
Vol 386 (1-3) ◽  
pp. 311-314 ◽  
Author(s):  
Zhanghua Wu ◽  
Tomonobu Nakayama ◽  
Makoto Sakurai ◽  
Masakazu Aono

1990 ◽  
Vol 65 (2) ◽  
pp. 247-250 ◽  
Author(s):  
R. Wiesendanger ◽  
H.-J. Güntherodt ◽  
G. Güntherodt ◽  
R. J. Gambino ◽  
R. Ruf

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 23-50 ◽  
Author(s):  
HAI XU ◽  
XIAN NING XIE ◽  
M. A. K. ZILANI ◽  
WEI CHEN ◽  
ANDREW THYE SHEN WEE

Nanoscale characterization is a key field in nanoscience and technology as it provides fundamental understanding of the properties and functionalities of materials down to the atomic and molecular scale. In this article, we review the development and application of scanning tunneling microscope (STM) techniques in nanoscale characterization. We will discuss the working principle, experimental setup, operational modes, and tip preparation methods of scanning tunneling microscope. Selected examples are provided to illustrate the application of STM in the nanocharacterization of semiconductors. In addition, new developments in STM techniques including spin-polarized STM (SP-STM) and multi-probe STM (MP-STM) are discussed in comparison with conventional non-magnetic and single tip STM methods.


2010 ◽  
Vol 96 (13) ◽  
pp. 132505 ◽  
Author(s):  
M. Ziegler ◽  
N. Ruppelt ◽  
N. Néel ◽  
J. Kröger ◽  
R. Berndt

2021 ◽  
Vol 7 (4) ◽  
pp. eabd7302
Author(s):  
Lucas Schneider ◽  
Philip Beck ◽  
Jens Wiebe ◽  
Roland Wiesendanger

A scanning tunneling microscope (STM) with a magnetic tip that has a sufficiently strong spin polarization can be used to map the sample’s spin structure down to the atomic scale but usually lacks the possibility to absolutely determine the value of the sample’s spin polarization. Magnetic impurities in superconducting materials give rise to pairs of perfectly, i.e., 100%, spin-polarized subgap resonances. In this work, we functionalize the apex of a superconducting Nb STM tip with such impurity states by attaching Fe atoms to probe the spin polarization of atom-manipulated Mn nanomagnets on a Nb(110) surface. By comparison with spin-polarized STM measurements of the same nanomagnets using Cr bulk tips, we demonstrate an extraordinary spin sensitivity and the possibility to measure the sample’s spin-polarization values close to the Fermi level quantitatively with our new functionalized probes.


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