Control of spin-polarized current in a scanning tunneling microscope by single-atom transfer

2010 ◽  
Vol 96 (13) ◽  
pp. 132505 ◽  
Author(s):  
M. Ziegler ◽  
N. Ruppelt ◽  
N. Néel ◽  
J. Kröger ◽  
R. Berndt
Keyword(s):  
Scanning Tunneling Microscope ◽  
Single Atom ◽  
Scanning Tunneling ◽  
Atom Transfer ◽  
Tunneling Microscope ◽  
Spin Polarized

Spin-Polarized Scanning Tunneling Microscopy (SPSTM)

1991 ◽  
Vol 231 ◽  
Author(s):  
R. Wiesendanger ◽  
D. Buergler ◽  
G. Tarrach ◽  
I.V. Shvets ◽  
H.-J. Guentherodt
Keyword(s):  
Scanning Tunneling Microscope ◽  
High Spatial Resolution ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Promising Technique ◽  
Polarized Electrons ◽  
Tunneling Microscope ◽  
Magnetic Structures ◽  
Spin Polarized

AbstractWe report on a novel promising technique for the investigation of magnetic structures at surfaces at high spatial resolution, ultimately down to the atomic scale. This technique is based on the observation of vacuum tunneling of spin-polarized electrons by means of a scanning tunneling microscope (STM). We discuss appropriate probe tips for the spin-polarized STM (SPSTM) and describe initial experimental results. We further focus on the information obtained by SPSTM. Finally, the perspectives of SPSTM will be discussed.

Spin-polarized electron tunneling detected using a scanning tunneling microscope

1997 ◽  
Vol 386 (1-3) ◽  
pp. 311-314 ◽  
Author(s):  
Zhanghua Wu ◽  
Tomonobu Nakayama ◽  
Makoto Sakurai ◽  
Masakazu Aono
Keyword(s):  
Scanning Tunneling Microscope ◽  
Electron Tunneling ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Spin Polarized

Shot noise from single atom contacts in a scanning tunneling microscope

2016 ◽  
Vol 643 ◽  
pp. 10-12 ◽  
Author(s):  
Andreas Burtzlaff ◽  
Natalia L. Schneider ◽  
Alexander Weismann ◽  
Richard Berndt
Keyword(s):  
Shot Noise ◽  
Scanning Tunneling Microscope ◽  
Single Atom ◽  
Scanning Tunneling ◽  
Tunneling Microscope

Observation of vacuum tunneling of spin-polarized electrons with the scanning tunneling microscope

1990 ◽  
Vol 65 (2) ◽  
pp. 247-250 ◽  
Author(s):  
R. Wiesendanger ◽  
H.-J. Güntherodt ◽  
G. Güntherodt ◽  
R. J. Gambino ◽  
R. Ruf
Keyword(s):  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Polarized Electrons ◽  
Tunneling Microscope ◽  
Spin Polarized

scholarly journals The Formation of Self-Assembled Nanowire Arrays on Ge(001): a DFT Study of Pt Induced Nanowire Arrays

2009 ◽  
Vol 1177 ◽  
Author(s):  
Danny Eric Paul Vanpoucke ◽  
Geert Brocks
Keyword(s):  
Scanning Tunneling Microscope ◽  
Density Functional ◽  
Nanowire Arrays ◽  
Single Atom ◽  
Scanning Tunneling ◽  
Checkerboard Pattern ◽  
High Temperature Annealing ◽  
Functional Theory ◽  
Tunneling Microscope ◽  
Stm Images

AbstractNanowire (NW) arrays form spontaneously after high temperature annealing of a sub monolayer deposition of Pt on a Ge(001) surface. These NWs are a single atom wide, with a length limited only by the underlying beta-terrace to which they are uniquely connected. Using ab-initio density functional theory (DFT) calculations we study possible geometries of the NWs and substrate. Direct comparison to experiment is made via calculated scanning tunneling microscope (STM) images. Based on these images, geometries for the beta-terrace and the NWs are identified, and a formation path for the nanowires as function of increasing local Pt density is presented. We show the beta-terrace to be a dimer row surface reconstruction with a checkerboard pattern of Ge-Ge and Pt-Ge dimers. Most remarkably, comparison of calculated to experimental STM images shows the NWs to consist of germanium atoms embedded in the Pt-lined troughs of the underlying surface, contrary to what was assumed previously in experiments.

Conductance step for a single-atom contact in the scanning tunneling microscope: Noble and transition metals

1996 ◽  
Vol 53 (23) ◽  
pp. 16086-16090 ◽  
Author(s):  
C. Sirvent ◽  
J. G. Rodrigo ◽  
S. Vieira ◽  
L. Jurczyszyn ◽  
N. Mingo ◽  
...  
Keyword(s):  
Transition Metals ◽  
Scanning Tunneling Microscope ◽  
Single Atom ◽  
Scanning Tunneling ◽  
Tunneling Microscope

NANOSCALE CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 23-50 ◽  
Author(s):  
HAI XU ◽  
XIAN NING XIE ◽  
M. A. K. ZILANI ◽  
WEI CHEN ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Preparation Methods ◽  
New Developments ◽  
Tunneling Microscope ◽  
Spin Polarized ◽  
Nanoscale Characterization ◽  
Working Principle ◽  
Operational Modes

Nanoscale characterization is a key field in nanoscience and technology as it provides fundamental understanding of the properties and functionalities of materials down to the atomic and molecular scale. In this article, we review the development and application of scanning tunneling microscope (STM) techniques in nanoscale characterization. We will discuss the working principle, experimental setup, operational modes, and tip preparation methods of scanning tunneling microscope. Selected examples are provided to illustrate the application of STM in the nanocharacterization of semiconductors. In addition, new developments in STM techniques including spin-polarized STM (SP-STM) and multi-probe STM (MP-STM) are discussed in comparison with conventional non-magnetic and single tip STM methods.

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