Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data

2003 ◽  
Vol 83 (3) ◽  
pp. 473-475 ◽  
Author(s):  
P.-O. Renault ◽  
E. Le Bourhis ◽  
P. Villain ◽  
Ph. Goudeau ◽  
K. F. Badawi ◽  
...  
Keyword(s):  
Thin Films ◽  
Elastic Constants ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
X Ray

Structure analysis of YBa2Cu3O7-δ thin films from X-ray diffraction data using Rietveld method

1994 ◽  
Vol 235-240 ◽  
pp. 633-634
Author(s):  
M. Pissas ◽  
E. Moraitakis ◽  
V. Phycharis ◽  
D. Niarchos
Keyword(s):  
Thin Films ◽  
Structure Analysis ◽  
Diffraction Data ◽  
Rietveld Method ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Study of Structural Properties of Annealed Cdo and Zno Thin Films

2017 ◽  
Vol 14 (2) ◽  
pp. 164-168
Author(s):  
Kishor Hurde ◽  
A. B. Lad
Keyword(s):  
Thin Films ◽  
Structural Properties ◽  
Thermal Annealing ◽  
Diffraction Data ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transparent Conducting ◽  
Resistance To Oxidation

The CdO and ZnO are n- type semiconductors are transparent conducting in nature, inexpensive, mechanically stable and highly resistance to oxidation. In the present work these films have been obtained from thermal annealing of chemically deposited CdS and ZnS thin films. The structural properties of chemically deposited CdS and ZnS thin films and thermally annealed CdO and ZnO thin films have been studied. From x-ray diffraction data it is observed that annealing of the thin films at a particular temperature enhance the structural properties.

Analysis of X-Ray Diffraction Data for the Characterization of Residual Stress

1991 ◽  
Vol 35 (A) ◽  
pp. 561-569
Author(s):  
Jun S. Park ◽  
James F. Shackelford
Keyword(s):  
Residual Stress ◽  
Elastic Constants ◽  
Diffraction Data ◽  
Stress Gradient ◽  
Bearing Steel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Angle ◽  
Stress States ◽  
Depth Ranges

AbstractThe analysis of linear dϕψ vs sin2ψ x-ray diffraction data in isotropic single phase materials was investigated for the evaluation of x-ray elastic constants. This study developed an experimental model for estimating x-ray elastic constants based on the analysis of biaxial residual stress states, A ball bearing steel and a 1018 steel weldment were evaluated.In a second study, the measurement of residual stress gradients was evaluated for those depth ranges mat can not be evaluated with a single radiation. This requires various planes and radiation energies to obtain the simultaneous conditions of high diffraction angle and large x-ray penetration depth. The evaluation of the overlapped stress gradient region is illustrated in terms of x-ray energy and diffraction angle for the ease of iron. This analysis is specifically developed for the purpose of stress gradient measurement using synchrotron radiation.

Stress and elastic-constant analysis by X-ray diffraction in thin films

2003 ◽  
Vol 36 (3) ◽  
pp. 869-879 ◽  
Author(s):  
F. Badawi ◽  
P. Villain
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Residual Stresses ◽  
Elastic Constants ◽  
Thermal Stresses ◽  
Bulk Material ◽  
Poisson Ratio ◽  
Young Modulus ◽  
X Ray Diffraction ◽  
X Ray

Residual stresses influence most physical properties of thin films and are closely related to their microstructure. Among the most widely used methods, X-ray diffraction is the only one allowing the determination of both the mechanical and microstructural state of each diffracting phase. Diffracting planes are used as a strain gauge to measure elastic strains in one or several directions of the diffraction vector. Important information on the thin-film microstructure may also be extracted from the width of the diffraction peaks: in particular, the deconvolution of these peaks allows values of coherently diffracting domain size and microdistortions to be obtained. The genesis of residual stresses in thin films results from multiple mechanisms. Stresses may be divided into three major types: epitaxic stresses, thermal stresses and intrinsic stresses. Diffraction methods require the knowledge of the thin-film elastic constants, which may differ from the bulk-material values as a result of the particular microstructure. Combining an X-ray diffractometer with a tensile tester, it is possible to determine X-ray elastic constants of each diffracting phase in a thin-film/substrate system, in particular the Poisson ratio and the Young modulus. It is important to notice that numerous difficulties relative to the application of diffraction methods may arise in the case of thin films.

Structural and Elastic Properties of HF/ZR Multilayer Thin Films

1990 ◽  
Vol 187 ◽  
Author(s):  
W. J. Meng ◽  
G. L. Eesley ◽  
K. Svinarich ◽  
G. P. Meisner
Keyword(s):  
Thin Films ◽  
Elastic Properties ◽  
Elastic Constants ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
Deposition Rates ◽  
X Ray ◽  
Effective Elastic Constants

AbstractWe have investigated structural and elastic properties of Hf/Zr multilayer thin films by x-ray diffraction and transient piezoreflectance measurements. Similar structural and elastic behaviors have been observed in two series of samples grown at different deposition rates (1 – 10Å/sec). Our measurements suggest different (˜ 10%) effective elastic constants between multilayers with coherent and incoherent interfaces.

Chemical vapor deposition of superconducting Bi-Sr-Ca-Cu-O films using fluorocarbon-based precursors

1990 ◽  
Vol 5 (1) ◽  
pp. 1-4 ◽  
Author(s):  
Masanori Nemoto ◽  
Mitsugu Yamanaka
Keyword(s):  
Thin Films ◽  
Chemical Vapor Deposition ◽  
Diffraction Data ◽  
Vapor Deposition ◽  
Substrate Surface ◽  
Chemical Vapor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Resistivity Measurements ◽  
First Time

Superconducting Bi-Sr-Ca-Cu-O thin films have been prepared for the first time by chemical vapor deposition using triphenyl bismuth and fluorocarbon-based chelates such as bis(hexafluoroacetylacetonate)strontium, bis(hexafluoroacetylacetonate)calcium, and bis(hexafluoroacetylacetonate)copper. After annealing in air, x-ray diffraction data reveal that the films deposited on (001) SrTiO3 substrates have preferential orientation of their crystalline c-axis perpendicular to the substrate surface. Four-probe resistivity measurements reveal the onset of superconductivity at 80 K and zero resistivity at 50 K.

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