Energy level evolution at a silole/magnesium thin-film interface

2003 ◽  
Vol 82 (22) ◽  
pp. 3889-3891 ◽  
Author(s):  
A. J. Mäkinen ◽  
M. Uchida ◽  
Z. H. Kafafi
2007 ◽  
Vol 21 (18n19) ◽  
pp. 3455-3458
Author(s):  
ANPING LIU ◽  
YINFENG WANG ◽  
XUEHENG YANG

The Zr -doped TiN coating, a nanometer (Ti, Zr)N thin film, has been deposited by reactive magnetron sputtering on slides and Al substrates. The crystalline phase and energy band structure have been analyzed by XRD and STS. The results of XRD show that the (Ti, Zr)N film is poly crystalline and consisted of mixed crystal of TiN and ZrN phase. The STS spectra show that Zr -doping didn't change the position and band-gap of energy level, only two new energy levels appeared, Eg = 0.33eV and Eg = 0.42eV. According to the results of measurement, (Ti, Zr)N has higher hardness and better corrosion resistance than TiN by Zr -doping.


1990 ◽  
Vol 15 (2) ◽  
pp. 126-134 ◽  
Author(s):  
G. P. Chambers ◽  
B. D. Sartwell

2011 ◽  
Vol 55 (3) ◽  
pp. 31301 ◽  
Author(s):  
S.R. McHale ◽  
J.W. McClory ◽  
J.C. Petrosky ◽  
J. Wu ◽  
A. Rivera ◽  
...  

2015 ◽  
Vol 44 (1) ◽  
pp. 20140409 ◽  
Author(s):  
Junyan Yi ◽  
Shihui Shen ◽  
Dongsheng Wang ◽  
Yudong Huang ◽  
Decheng Feng

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