Optical and structural properties of SiOxNyHz films deposited by electron cyclotron resonance and their correlation with composition
2001 ◽
Vol 10
(3-7)
◽
pp. 1264-1267
◽
1997 ◽
Vol 173
(3-4)
◽
pp. 260-265
◽
1999 ◽
Vol 8
(2-5)
◽
pp. 586-590
◽
1984 ◽
Vol 45
(C1)
◽
pp. C1-961-C1-963
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