Analysis of self-focusing beams of concentric symmetry in As2S3 glass using a near-field scanning optical microscope

2003 ◽  
Vol 82 (15) ◽  
pp. 2416-2418 ◽  
Author(s):  
Jaekwang Lee ◽  
Soon-Bin Park ◽  
Kyuman Cho ◽  
Ki-Bong Song
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Self Focusing ◽  
Near Field Scanning

Direct Observation of Self-Focusing with Subdiffraction Limited Resolution Using Near-Field Scanning Optical Microscope

2000 ◽  
Vol 85 (18) ◽  
pp. 3842-3845 ◽  
Author(s):  
Ki-Bong Song ◽  
Jaekwang Lee ◽  
Jong-Hoi Kim ◽  
Kyuman Cho ◽  
Soon-Kwang Kim
Keyword(s):  
Direct Observation ◽  
Near Field ◽  
Optical Microscope ◽  
Self Focusing ◽  
Near Field Scanning

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

EXCITON–PLASMON INTERACTION IN MONOLAYERS OF METAL-SEMICONDUCTOR NANOSTRUCTURES

2011 ◽  
Vol 10 (04n05) ◽  
pp. 623-627 ◽  
Author(s):  
M. HARIDAS ◽  
L. N. TRIPATHI ◽  
J. K. BASU
Keyword(s):  
Gold Nanoparticles ◽  
Metallic Nanoparticles ◽  
Near Field ◽  
Blue Shift ◽  
Optical Microscope ◽  
Peak Position ◽  
Photoluminescence Spectra ◽  
Langmuir Blodgett ◽  
Near Field Scanning ◽  
Cdse Nanorods

Effect of shape and density on the energy transfer between metallic nanoparticles and semi conducting nanostructures was studied by observing the photoluminescence spectra using near field scanning optical microscope. The monolayers of gold nanoparticles, CdSe nanorods and composite with different number ratios were prepared using Langmuir Blodgett method. The spectra collected from the films with different number ratios of CdSe and gold shows a systematic variation of peak position and intensity as a function of number density of CdSe . The photoluminescence spectra collected from composite monolayer is blue shifted compared to the spectra from CdSe nanorods monolayer. Further we observed a blue shift in peak position and reduction emission intensity with respect to increase in the fraction of gold nanoparticles and surface density. We have provided explanation for the observed behavior in terms of strong exciton–plasmon interactions in the compact hybrid monolayers.

Direct Photocurrent Mapping of Organic Solar Cells Using a Near-Field Scanning Optical Microscope

Nano Letters ◽  
2004 ◽  
Vol 4 (2) ◽  
pp. 219-223 ◽  
Author(s):  
Christopher R. McNeill ◽  
Holger Frohne ◽  
John L. Holdsworth ◽  
John E. Furst ◽  
Bruce V. King ◽  
...  
Keyword(s):  
Solar Cells ◽  
Organic Solar Cells ◽  
Near Field ◽  
Optical Microscope ◽  
Near Field Scanning

Near-field scanning optical microscope probe analysis

2008 ◽  
Vol 108 (7) ◽  
pp. 671-676 ◽  
Author(s):  
Petr Klapetek ◽  
Jiří Buršík ◽  
Miroslav Valtr ◽  
Jan Martinek
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Probe Analysis ◽  
Near Field Scanning ◽  
Microscope Probe
Sign in / Sign up

Export Citation Format

Share Document