Enhanced conversion of thermal electron Bernstein waves to the extraordinary electromagnetic mode on the National Spherical Torus Experiment

2003 ◽  
Vol 10 (5) ◽  
pp. 1395-1401 ◽  
Author(s):  
G. Taylor ◽  
P. C. Efthimion ◽  
B. Jones ◽  
B. P. LeBlanc ◽  
J. R. Wilson ◽  
...  
Keyword(s):  
Spherical Torus ◽  
Thermal Electron ◽  
Electromagnetic Mode ◽  
Bernstein Waves

Efficient coupling of thermal electron Bernstein waves to the ordinary electromagnetic mode on the National Spherical Torus Experiment

2005 ◽  
Vol 12 (5) ◽  
pp. 052511 ◽  
Author(s):  
G. Taylor ◽  
P. C. Efthimion ◽  
B. P. LeBlanc ◽  
M. D. Carter ◽  
J. B. Caughman ◽  
...  
Keyword(s):  
Spherical Torus ◽  
Thermal Electron ◽  
Electromagnetic Mode ◽  
Bernstein Waves ◽  
Efficient Coupling

Efficient generation of noninductive, off-axis, Ohkawa current, driven by electron Bernstein waves in high β, spherical torus plasmas

2004 ◽  
Vol 11 (10) ◽  
pp. 4733-4739 ◽  
Author(s):  
G. Taylor ◽  
P. C. Efthimion ◽  
C. E. Kessel ◽  
R. W. Harvey ◽  
A. P. Smirnov ◽  
...  
Keyword(s):  
Spherical Torus ◽  
Efficient Generation ◽  
Bernstein Waves

scholarly journals Efficient Generation of Non-Inductive, Off-axis, Ohkawa Current, Driven by Electron Bernstein Waves in High Beta, Spherical Torus Plasmas

2004 ◽  
Author(s):  
G. Taylor ◽  
P.C. Efthimion ◽  
C.E. Kessel ◽  
R.W. Harvey ◽  
A.P. Smirnov ◽  
...  
Keyword(s):  
Spherical Torus ◽  
Efficient Generation ◽  
Bernstein Waves ◽  
High Beta

Recent developments in low-voltage SEM of polymers

1993 ◽  
Vol 51 ◽  
pp. 866-867
Author(s):  
S.J. Krause ◽  
W.W. Adams
Keyword(s):  
Low Voltage ◽  
Chromatic Aberration ◽  
Thermal Electron ◽  
Analytical Technique ◽  
Recent Developments ◽  
Beam Currents ◽  
New Generation ◽  
First Time ◽  
Voltage Scanning ◽  
Beam Damage

Over the past decade low voltage scanning electron microscopy (LVSEM) of polymers has evolved from an interesting curiosity to a powerful analytical technique. This development has been driven by improved instrumentation and in particular, reliable field emission gun (FEG) SEMs. The usefulness of LVSEM has also grown because of an improved theoretical and experimental understanding of sample-beam interactions and by advances in sample preparation and operating techniques. This paper will review progress in polymer LVSEM and present recent results and developments in the field.In the early 1980s a new generation of SEMs produced beam currents that were sufficient to allow imaging at low voltages from 5keV to 0.5 keV. Thus, for the first time, it became possible to routinely image uncoated polymers at voltages below their negative charging threshold, the "second crossover", E2 (Fig. 1). LVSEM also improved contrast and reduced beam damage in sputter metal coated polymers. Unfortunately, resolution was limited to a few tenths of a micron due to the low brightness and chromatic aberration of thermal electron emission sources.

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