X-ray scattering patterns of model liquid crystals from computer simulation: Calculation and analysis

2003 ◽  
Vol 118 (14) ◽  
pp. 6605-6614 ◽  
Author(s):  
Martin A. Bates ◽  
Geoffrey R. Luckhurst
RSC Advances ◽  
2017 ◽  
Vol 7 (64) ◽  
pp. 40480-40485 ◽  
Author(s):  
Richard J. Mandle ◽  
Stephen J. Cowling ◽  
John W. Goodby

A combination of microscopy, X-ray scattering, calorimetry and applied electric field studies demonstrates the 4-alkoxy-4′-nitrobiphenyls are potentially of use for next generation, backlight free scattering mode LCD devices.


Soft Matter ◽  
2019 ◽  
Vol 15 (16) ◽  
pp. 3315-3322 ◽  
Author(s):  
Taiki Hoshino ◽  
Masanari Nakayama ◽  
So Fujinami ◽  
Tomotaka Nakatani ◽  
Yoshiki Kohmura ◽  
...  

The static structure and dynamics of liquid-crystalline colloidal dispersions of hydroxyapatite nanorods are studied using X-ray scattering techniques.


2014 ◽  
pp. 1-38 ◽  
Author(s):  
Dena M. Agra-Kooijman ◽  
Satyendra Kumar

2007 ◽  
Vol 75 (22) ◽  
Author(s):  
Dominik Daisenberger ◽  
Mark Wilson ◽  
Paul F. McMillan ◽  
Raul Quesada Cabrera ◽  
Martin C. Wilding ◽  
...  

1996 ◽  
Vol 439 ◽  
Author(s):  
P. J. Partyka ◽  
R. S. Averback ◽  
K. Nordlund ◽  
I. K. Robinson ◽  
D. Walko ◽  
...  

AbstractDiffuse x-ray scattering (DXS) and computer simulation techniques were employed to investigate the defect structure produced in Si by low keV ion and MeV electron irradiations. DXS measurements were performed for keV Ga and He implants, demonstrating the ability of the technique to provide both bulk and near-surface measurements at defect concentrations of about 1000 ppm. A rigorous analysis of these results is complicated due to the complex nature of the ion damage in Si. A computer simulation framework is developed to aid in the analysis of this data. In this technique, defects are simulated and their strain fields are calculated by simply relaxing the atoms around the defect to their equilibrium positions. The diffuse scattering is then calculated from the strain field, and the results are compared to the experimental measurements. Computer simulations are presented here only for the case of electron irradiation damage and compared to published measurements. Application of the technique to more complicated structures is planned and should pose no serious problems in the computational framework already developed.


2015 ◽  
Vol 3 (33) ◽  
pp. 8566-8573 ◽  
Author(s):  
A. Meneses-Franco ◽  
A. E. Fierro-Armijo ◽  
P. Romero-Hasler ◽  
L. G. Salamanca-Riba ◽  
L. J. Martínez-Miranda ◽  
...  

We synthesized monomeric liquid crystals, M6R8 and I6R8, and nanoparticles of TiO2, to form a nanocomposite, which was characterized by polarized optical microscopy (POM), DSC and structurally with both wide angle X-ray diffraction and by X-ray scattering using the planar geometry.


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