Multiple-Auger electron ejection after inner-shell ionization and excitation

2003 ◽  
Author(s):  
Jens Viefhaus
Keyword(s):  
Auger Electron ◽  
Inner Shell Ionization ◽  
Electron Ejection ◽  
Shell Ionization

scholarly journals The inner shell ionization of the atom by electrons

2008 ◽  
Vol 6 (1) ◽  
pp. 1-9
Author(s):  
A.R. Tancic ◽  
M. Nikolic ◽  
Z. Rakocevic
Keyword(s):  
Auger Electron ◽  
Rare Gas ◽  
Line Profiles ◽  
Auger Decay ◽  
Electron Spectra ◽  
Auger Spectra ◽  
Inner Shell Ionization ◽  
Resonant Processes ◽  
Shell Ionization ◽  
Auger Electron Spectra

In this paper, the resonant processes of inner-shell ionization of some atoms, followed by the Auger decay of the created vacancy was considered. The analytical expression for the line profiles in the Auger-electron spectra was analyzed. The line shift in the Auger spectra of the rare gas atom inner-shells was also considered.

The measurement of inner-shell ionization cross aections by electron impact in a TEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1266-1267
Author(s):  
Raynald Gauvin ◽  
Gilles L'Espérance
Keyword(s):  
Electron Impact ◽  
Cross Sections ◽  
Weight Fraction ◽  
Thin Foil ◽  
Specimen Thickness ◽  
Ionization Cross ◽  
Electron Dose ◽  
Total Electron ◽  
Inner Shell Ionization ◽  
Shell Ionization

Values of cross sections for ionization of inner-shell electrons by electron impact are required for electron probe microanalysis, Auger-electron spectroscopy and electron energy-loss spectroscopy. In this work, the results of the measurement of inner-shell ionization cross-sections by electron impact, Q, in a TEM are presented for the K shell.The measurement of QNi has been performed at 120 KeV in a TEM by measuring the net X-ray intensity of the Kα line of Ni, INi, which is related to QNi by the relation :(1)where i is the total electron dose, (Ω/4π)is the fractional solid angle, ω is the fluorescence yield, α is the relative intensity factor, ε is the Si (Li) detector efficiency, A is the atomic weight, ρ is the sample density, No is Avogadro's number, t' is the distance traveled by the electrons in the specimen which is equal to τ sec θ neglecting beam broadening where τ is the specimen thickness and θ is the angle between the electron beam and the normal of the thin foil and CNi is the weight fraction of Ni.

An improved calculation for the inner-shell ionization problems

1982 ◽  
Vol 92 (3) ◽  
pp. 127-130 ◽  
Author(s):  
J.N. Das ◽  
S. Chakraborty
Keyword(s):  
Inner Shell Ionization ◽  
Shell Ionization

Cross Sections for Inner-Shell Ionization by Electron Impact

2014 ◽  
Vol 43 (1) ◽  
pp. 013102 ◽  
Author(s):  
Xavier Llovet ◽  
Cedric J. Powell ◽  
Francesc Salvat ◽  
Aleksander Jablonski
Keyword(s):  
Electron Impact ◽  
Cross Sections ◽  
Inner Shell Ionization ◽  
Shell Ionization

ICSC: a program for calculating inelastic scattering cross sections for fast electrons incident on crystals

2003 ◽  
Vol 36 (3) ◽  
pp. 940-943 ◽  
Author(s):  
M. P. Oxley ◽  
L. J. Allen
Keyword(s):  
Inelastic Scattering ◽  
Cross Sections ◽  
Dark Field ◽  
Fast Electrons ◽  
Scattering Coefficients ◽  
Einstein Model ◽  
Annular Dark Field ◽  
Inner Shell Ionization ◽  
Scattering Cross Sections ◽  
Shell Ionization

A computer program which calculates inner-shell ionization and backscattering cross sections for fast electrons incident on a crystal is presented. The program calculates the inelastic scattering coefficients for inner-shell ionization, pertinent to electron energy loss spectroscopy and energy dispersive X-ray analysis, using recently presented parameterizations of the atomic scattering factors. Orientation-dependent cross sections, suitable for atom location by channelling enhanced microanalysis, may be calculated. Inelastic scattering coefficients that allow the calculation of orientation-dependent annular dark-field and Rutherford backscattering maps are calculated using an Einstein model. In all cases, absorption due to thermal diffuse scattering, also calculated using an Einstein model, can be included.

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