Combinatorial near-edge x-ray absorption fine structure: Simultaneous determination of molecular orientation and bond concentration on chemically heterogeneous surfaces

2003 ◽  
Vol 82 (2) ◽  
pp. 266-268 ◽  
Author(s):  
Jan Genzer ◽  
Daniel A. Fischer ◽  
Kirill Efimenko
2005 ◽  
Vol 21 (7) ◽  
pp. 769-773 ◽  
Author(s):  
Masaki TAKAOKA ◽  
Satoshi FUKUTANI ◽  
Takashi YAMAMOTO ◽  
Masato HORIUCHI ◽  
Naoya SATTA ◽  
...  

2004 ◽  
Vol 25 (1) ◽  
pp. 141-149 ◽  
Author(s):  
Daniel A. Fischer ◽  
Kirill Efimenko ◽  
Rajendra R. Bhat ◽  
Sharadha Sambasivan ◽  
Jan Genzer

1975 ◽  
Vol 11 (12) ◽  
pp. 4836-4846 ◽  
Author(s):  
E. A. Stern ◽  
D. E. Sayers ◽  
F. W. Lytle

1988 ◽  
Vol 143 ◽  
Author(s):  
S. M. Heald ◽  
G. M. Lamble

AbstractImportant for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni- Ti multilayers.


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