Time of flight secondary ion mass spectrometry study of silicon nanoclusters embedded in thin silicon oxide layers

2003 ◽  
Vol 82 (1) ◽  
pp. 121-123 ◽  
Author(s):  
M. Perego ◽  
S. Ferrari ◽  
S. Spiga ◽  
E. Bonera ◽  
M. Fanciulli ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Silicon Oxide ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Silicon Nanoclusters ◽  
Oxide Layers ◽  
Mass Spectrometry Study ◽  
Ion Mass Spectrometry ◽  
Thin Silicon ◽  
Secondary Ion

Time-of-Flight Secondary Ion Mass Spectrometry Study of the Orientation of a Bifunctional Diblock Copolymer Attached to a Solid Substrate

Langmuir ◽  
2009 ◽  
Vol 25 (2) ◽  
pp. 1011-1019 ◽  
Author(s):  
Marek Jasieniak ◽  
Shuko Suzuki ◽  
Michael Monteiro ◽  
Edeline Wentrup-Byrne ◽  
Hans J. Griesser ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Diblock Copolymer ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Solid Substrate ◽  
Mass Spectrometry Study ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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