Versatile high resolution crystal spectrometer with x-ray charge coupled device detector

2003 ◽  
Vol 74 (4) ◽  
pp. 2388-2408 ◽  
Author(s):  
R. Barnsley ◽  
N. J. Peacock ◽  
J. Dunn ◽  
I. M. Melnick ◽  
I. H. Coffey ◽  
...  
Keyword(s):  
High Resolution ◽  
Crystal Spectrometer ◽  
Charge Coupled Device ◽  
X Ray

General purpose high‐resolution x‐ray crystal spectrometer (abstract)

1992 ◽  
Vol 63 (10) ◽  
pp. 5022-5022
Author(s):  
R. Barnsley ◽  
A. Abbey ◽  
J. Dunn ◽  
S. Lea ◽  
N. J. Peacock
Keyword(s):  
High Resolution ◽  
General Purpose ◽  
Crystal Spectrometer ◽  
X Ray

scholarly journals High-resolution x-ray crystal spectrometer/polarimeter at torus experiment for technology oriented research-94

2001 ◽  
Vol 72 (6) ◽  
pp. 2566-2574 ◽  
Author(s):  
J. Weinheimer ◽  
I. Ahmad ◽  
O. Herzog ◽  
H.-J. Kunze ◽  
G. Bertschinger ◽  
...  
Keyword(s):  
High Resolution ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Oriented Research

Atomic structure of YB56 studied by digital high-resolution electron microscopy and electron diffraction

2001 ◽  
Vol 16 (1) ◽  
pp. 101-107 ◽  
Author(s):  
Takeo Oku ◽  
Jan-Olov Bovin ◽  
Iwami Higashi ◽  
Takaho Tanaka ◽  
Yoshio Ishizawa
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
High Resolution Electron Microscopy ◽  
Charge Coupled Device ◽  
X Ray ◽  
Resolution Electron ◽  
High Resolution Images ◽  
Diffraction Patterns ◽  
Simulated Images

Atomic positions for Y atoms were determined by using high-resolution electron microscopy and electron diffraction. A slow-scan charge-coupled device camera which had high linearity and electron sensitivity was used to record high-resolution images and electron diffraction patterns digitally. Crystallographic image processing was applied for image analysis, which provided more accurate, averaged Y atom positions. In addition, atomic disordering positions in YB56 were detected from the differential images between observed and simulated images based on x-ray data, which were B24 clusters around the Y-holes. The present work indicates that the structure analysis combined with digital high-resolution electron microscopy, electron diffraction, and differential images is useful for the evaluation of atomic positions and disordering in the boron-based crystals.

A computer driven crystal spectrometer with charge coupled device detectors for x-ray spectroscopy of laser plasmas

1997 ◽  
Vol 68 (6) ◽  
pp. 2387-2392 ◽  
Author(s):  
Michel Koenig ◽  
Jean Michel Boudenne ◽  
P. Legriel ◽  
A. Benuzzi ◽  
T. Grandpierre ◽  
...  
Keyword(s):  
Crystal Spectrometer ◽  
Charge Coupled Device ◽  
X Ray ◽  
Laser Plasmas
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