Thickness determination of very thin SiO2 films on Si by electron-induced x-ray emission spectroscopy

2002 ◽  
Vol 81 (15) ◽  
pp. 2740-2742 ◽  
Author(s):  
C. Hombourger ◽  
P. Jonnard ◽  
E. O. Filatova ◽  
V. Lukyanov
Keyword(s):  
Emission Spectroscopy ◽  
Sio2 Films ◽  
X Ray ◽  
Thickness Determination

Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy

2006 ◽  
Vol 252 (6) ◽  
pp. 2375-2388 ◽  
Author(s):  
Werner Frammelsberger ◽  
Guenther Benstetter ◽  
Janice Kiely ◽  
Richard Stamp
Keyword(s):  
Sio2 Films ◽  
Thickness Determination

ANALYSIS OF SOLDERS ON TIN AND LEAD BASES BY X-RAY FLOORESCENT SPECTROSCOPY

2021 ◽  
pp. 124-131
Author(s):  
A.V. Alekseev ◽  
◽  
G.V. Orlov ◽  
P.S. Petrov ◽  
A.V. Slavin ◽  
...  
Keyword(s):  
Emission Spectroscopy ◽  
High Resolution Mass Spectrometry ◽  
Analytical Signal ◽  
Atomic Emission ◽  
Standard Samples ◽  
X Ray ◽  
Fundamental Parameters ◽  
The Matrix ◽  
Resolution Mass

The determination of the elements Cu, Ni, Sb, Bi, Pb, Zn and Fe in the tin-based solder VPr35, as well as the elements Sn, Ni, Sb, Bi and In in the lead-based VPr40 solder by the method of х-ray fluorescence spectroscopy has been carried out. The calibration dependences are corrected taking into account the superposition of signals from interfering elements on the analytical signal and changes in intensity caused by inter-element influences in the matrix. The analysis was carried out by the method of fundamental parameters without using standard samples. The correctness of the results obtained was confirmed by their comparative analysis by atomic emission spectroscopy and high-resolution mass spectrometry with a glow discharge.

Ion-Exchange Paper—X-Ray Emission Procedure for Determination of Microgram Quantities of Mercury

1964 ◽  
Vol 47 (2) ◽  
pp. 391-394
Author(s):  
William B Link ◽  
Keith S Heine ◽  
J H Jones ◽  
Percy Wattlington
Keyword(s):  
Zinc Oxide ◽  
Titanium Dioxide ◽  
Emission Spectroscopy ◽  
Barium Sulfate ◽  
Magnesium Stearate ◽  
Magnesium Carbonate ◽  
Acid Solutions ◽  
X Ray ◽  
Aqueous Acid

Abstract A method has been developed for determining 1 μg of mercury in 100 ml of aqueous acid solution with a precision of ± 0.25 μg. In the method, the mercury is adsorbed by anion resinloaded paper and determined by X-ray emission spectroscopy. The method gave 75—125% recoveries of 1 μg of mercury from acid solutions containing 10 g of sodium sulfate, sodium chloride, iron oxide, magnesium carbonate, and calcium carbonate, and satisfactory recoveries from the HCl extract of carbon, barium sulfate, chromic oxide, bentonite, kaolin, talc, titanium dioxide, and magnesium stearate. Substantial changes in flow rate or acid concentration seem to have little effect on mercury absorption from HC1 solution. Mercury in zinc oxide or bismuth oxychloride cannot be determined by this technique.

scholarly journals Thickness Determination of Surface Film for Textured Specimens by X-ray Diffraction

1997 ◽  
Vol 30 (1-2) ◽  
pp. 71-79 ◽  
Author(s):  
Liu Yu-Shu ◽  
Zhao Yu
Keyword(s):  
Surface Film ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thickness Determination

A simple and convenient X-ray diffraction method is proposed to determine the thickness of surface film for textured specimens. The analysis result for a synthetic specimen with surface film has proved that the method is applicable and reliable.

Accurate Thickness Determination of Both Thin SiO2on Si and Thin Si on SiO2by Angle-Resolved X-Ray Photoelectron Spectroscopy

1999 ◽  
Vol 38 (Part 1, No. 7A) ◽  
pp. 4172-4179 ◽  
Author(s):  
Toshiharu Katayama ◽  
Hidekazu Yamamoto ◽  
Masahiko Ikeno ◽  
Yoji Mashiko ◽  
Satoru Kawazu ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Thickness Determination

Traceable thickness determination of organic nanolayers by X-ray reflectometry

2014 ◽  
Vol 46 (10-11) ◽  
pp. 911-914 ◽  
Author(s):  
Jan Wernecke ◽  
Alexander G. Shard ◽  
Michael Krumrey
Keyword(s):  
X Ray ◽  
Thickness Determination
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