High frequency-bandwidth optical technique to measure thermal elongation time responses of near-field scanning optical microscopy probes
2002 ◽
Vol 73
(11)
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pp. 3837-3840
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2004 ◽
Vol 1
(9)
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pp. 2292-2297
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1999 ◽
Vol 194
(2-3)
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pp. 445-447
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