Morphological and biochemical analysis by atomic force microscopy and scanning near-field optical microscopy techniques of human keratinocytes (HaCaT) exposed to extremely low frequency 50 Hz magnetic field

2002 ◽  
Vol 81 (15) ◽  
pp. 2890-2892 ◽  
Author(s):  
Sabrina Rieti ◽  
Vanessa Manni ◽  
Antonella Lisi ◽  
Settimio Grimaldi ◽  
Renato Generosi ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Atomic Force Microscopy ◽  
Biochemical Analysis ◽  
Near Field ◽  
Low Frequency ◽  
Human Keratinocytes ◽  
Force Microscopy ◽  
Extremely Low Frequency ◽  
Atomic Force ◽  
Microscopy Techniques

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

scholarly journals Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

2014 ◽  
Vol 39 (16) ◽  
pp. 4800 ◽  
Author(s):  
C. H. van Hoorn ◽  
D. C. Chavan ◽  
B. Tiribilli ◽  
G. Margheri ◽  
A. J. G. Mank ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Probe

Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy

2003 ◽  
Vol 97 (1-4) ◽  
pp. 81-87 ◽  
Author(s):  
Tomoyuki Yoshino ◽  
Shigeru Sugiyama ◽  
Shoji Hagiwara ◽  
Daisuke Fukushi ◽  
Motoharu Shichiri ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Force Microscopy ◽  
Nano Scale ◽  
Atomic Force

Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

2016 ◽  
Vol 55 (8S1) ◽  
pp. 08NB04 ◽  
Author(s):  
Nobuo Satoh ◽  
Kei Kobayashi ◽  
Shunji Watanabe ◽  
Toru Fujii ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Piezoelectric Cantilever ◽  
Mechanical Detection
Sign in / Sign up

Export Citation Format

Share Document