Quantitative characterization of the fabrication processes of domain-inverted layers in LiTaO3 by the line-focus-beam ultrasonic material characterization system

2002 ◽  
Vol 92 (7) ◽  
pp. 3958-3966
Author(s):  
Masahito Miyashita ◽  
Jun-ichi Kushibiki
Keyword(s):  
Material Characterization ◽  
Focus Beam ◽  
Quantitative Characterization ◽  
Line Focus

Chemical composition characterization of Ca3Ta(Ga0.5Al0.5)3Si2O14 single crystal by the line-focus-beam ultrasonic material characterization system

2016 ◽  
Vol 452 ◽  
pp. 141-145 ◽  
Author(s):  
Yuji Ohashi ◽  
Tetsuo Kudo ◽  
Yuui Yokota ◽  
Yasuhiro Shoji ◽  
Shunsuke Kurosawa ◽  
...  
Keyword(s):  
Chemical Composition ◽  
Single Crystal ◽  
Material Characterization ◽  
Focus Beam ◽  
Line Focus

Evaluation of SiO2 Thin films on piezoelectric substrates using line-focus-beam ultrasonic material characterization system

2019 ◽  
Vol 58 (SG) ◽  
pp. SGGA05 ◽  
Author(s):  
Ryota Suenaga ◽  
Masashi Suzuki ◽  
Shoji Kakio ◽  
Yuji Ohashi ◽  
Mototaka Arakawa ◽  
...  
Keyword(s):  
Thin Films ◽  
Material Characterization ◽  
Focus Beam ◽  
Line Focus

Characterization of Domain-Inverted Layers in LiTaO 3 by Line-Focus-Beam Acoustic Microscopy

1997 ◽  
Vol 36 (Part 2, No. 7B) ◽  
pp. L959-L961 ◽  
Author(s):  
Jun-ichi Kushibiki ◽  
Masahito Miyashita
Keyword(s):  
Acoustic Microscopy ◽  
Focus Beam ◽  
Line Focus

Material Characterization by Acoustic Microscope with Line-Focus Beam

1982 ◽  
pp. 101-111 ◽  
Author(s):  
Jun-ichi Kushibiki ◽  
Akira Ohkubo ◽  
Noriyoshi Chubachi
Keyword(s):  
Material Characterization ◽  
Focus Beam ◽  
Acoustic Microscope ◽  
Line Focus
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