Optical constants and thickness determination of very thin amorphous semiconductor films

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S. D. Ventura ◽  
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Amorphous Semiconductor ◽  
Semiconductor Films ◽  
Thickness Determination

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Optical Constants ◽  
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Determination of optical constants and band gaps of bilayered semiconductor films

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1995 ◽  
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pp. 309-313 ◽  
Author(s):  
D Bhattacharyya ◽  
S Chaudhuri ◽  
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Keyword(s):  
Optical Constants ◽  
Band Gaps ◽  
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Vol 35 (12) ◽  
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Chengxiang Ji ◽  
Ying Yang ◽  
Y. Austin Chang ◽  
Feng X. Liu ◽  
...  
Keyword(s):  
Tunnel Junctions ◽  
Oxide Films ◽  
Magnetic Tunnel Junctions ◽  
Thickness Determination ◽  
Ultrathin Oxide Films ◽  
Ultrathin Oxide

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants
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