Use of near-surface channel conductance and differential capacitance versus potential measurements to correlate inversion layer formation with low effective surface recombination velocities at n-Si/liquid contacts
Keyword(s):
Keyword(s):
2006 ◽
Vol 13
(5)
◽
pp. 1093-1100
◽
Keyword(s):
1996 ◽
Vol 228
(3-4)
◽
pp. 363-368
◽