Band gap energy bowing and residual strain in CuAl(SxSe1−x)2 chalcopyrite semiconductor epilayers grown by low-pressure metalorganic vapor phase epitaxy
2001 ◽
Vol 226
(4)
◽
pp. 473-480
◽
2011 ◽
Vol 50
(9)
◽
pp. 095502
◽
Keyword(s):