scholarly journals Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes

2002 ◽  
Vol 80 (11) ◽  
pp. 1996-1998 ◽  
Author(s):  
T. Larsen ◽  
K. Moloni ◽  
F. Flack ◽  
M. A. Eriksson ◽  
M. G. Lagally ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Wear Characteristics ◽  
Force Microscopy ◽  
Atomic Force ◽  
Etched Silicon

Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects

2012 ◽  
Vol 23 (30) ◽  
pp. 305707 ◽  
Author(s):  
A Schulze ◽  
T Hantschel ◽  
A Dathe ◽  
P Eyben ◽  
X Ke ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Electrical Tomography ◽  
Force Microscopy ◽  
Atomic Force

The Attachment of Carbon Nanotube on a Blunt AFM Tip Using Electric Fields

2004 ◽  
Author(s):  
Hyung Woo Lee ◽  
Soon Geun Kwon ◽  
Soo Hyun Kim ◽  
Yoon Keun Kwak ◽  
Chang Soo Han
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Electric Fields ◽  
Low Cost ◽  
Reliable Technique ◽  
Force Microscopy ◽  
Atomic Force

We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip’s apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.

Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

2013 ◽  
Vol 378 ◽  
pp. 466-471
Author(s):  
Po Jen Shih ◽  
Shang Hao Cai
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Frequency Responses ◽  
Atomic Force ◽  
Frequency Drop ◽  
Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

Atomic Force Microscopy Studies of DNA-Wrapped Carbon Nanotube Structure and Binding to Quantum Dots

2008 ◽  
Vol 130 (32) ◽  
pp. 10648-10655 ◽  
Author(s):  
Jennifer F. Campbell ◽  
Ingrid Tessmer ◽  
H. Holden Thorp ◽  
Dorothy A. Erie
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Force Microscopy ◽  
Atomic Force

Dispersibility of Carbon Nanotubes

2007 ◽  
Vol 537-538 ◽  
pp. 161-168 ◽  
Author(s):  
T. Gábor ◽  
D. Aranyi ◽  
Katalin Papp ◽  
F.H. Kármán ◽  
Erika Kálmán
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Polymer Composites ◽  
Ionic Surfactant ◽  
Geometrical Parameters ◽  
Stable Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dispersion Agent

Availability of a stable carbon nanotube suspension is a prerequisite for production of polymer composites with carbon nanotube as additives. In this work nanotube suspensions, which have been prepared from various nanotubes in different dispersion agents, were compared. Dispersibility of the samples was investigated by scanning electon microscopy and atomic force microscopy. Solution of a non-ionic surfactant was also used successfully as a new dispersion agent. Geometrical parameters of the carbon nanotubes were determined by using atomic force microscopy. Correlation was found between the dispersibility and the parameters of the nanotubes and relative permittivity of the different solvents.

Atomic force microscopy of steep side-walled feature with carbon nanotube tip

2003 ◽  
Author(s):  
Byong Chon Park ◽  
Jae-Hyun Kang ◽  
Ki Y. Jung ◽  
Won Young Song ◽  
Beomhoan O ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Force Microscopy ◽  
Atomic Force
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