Fabrication and characterization of focused-ion-beam trimmed write heads for perpendicular magnetic recording

2002 ◽  
Vol 91 (10) ◽  
pp. 6836 ◽  
Author(s):  
T. W. Clinton ◽  
P. A. A. van der Heijden ◽  
D. C. Karns ◽  
J. Yu ◽  
C. M. Park ◽  
...  
Keyword(s):  
Magnetic Recording ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Perpendicular Magnetic Recording ◽  
Write Heads ◽  
Fabrication And Characterization

scholarly journals Fabrication and characterization of high-TcYBa2Cu3O7−xnanoSQUIDs made by focused ion beam milling

2008 ◽  
Vol 19 (31) ◽  
pp. 315304 ◽  
Author(s):  
C H Wu ◽  
Y T Chou ◽  
W C Kuo ◽  
J H Chen ◽  
L M Wang ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Fabrication And Characterization ◽  
Focused Ion Beam Milling

Fabrication and Characterization of Micron-Sized Compression Samples using a Focused Ion Beam Microscope

2004 ◽  
Vol 10 (S02) ◽  
pp. 1126-1127 ◽  
Author(s):  
Michael D Uchic ◽  
Robert Wheeler IV ◽  
Michael J Seekely ◽  
Dennis M Dimiduk
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Fabrication And Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fabrication and characterization of submicron gratings written in planar silica glass with a focused ion beam

1994 ◽  
Author(s):  
Jacques Albert ◽  
Bernard Malo ◽  
Francois Bilodeau ◽  
Derwyn C. Johnson ◽  
Kenneth O. Hill ◽  
...  
Keyword(s):  
Silica Glass ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Fabrication And Characterization ◽  
Submicron Gratings

Fabrication and Characterization of NdBaCuO-Josephson Junctions on MgO-Substrates Damaged by a Focused Ion Beam

1996 ◽  
Vol 35 (Part 2, No. 1A) ◽  
pp. L15-L18 ◽  
Author(s):  
Yoshihiro Ishimaru ◽  
Yuuji Mizuno ◽  
Katsumi Suzuki ◽  
Youichi Enomoto
Keyword(s):  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Fabrication And Characterization
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