Nanometric inversion domains in conventional molecular-beam-epitaxy GaN thin films observed by atomic-resolution high-voltage electron microscopy
1981 ◽
Vol 20
(11)
◽
pp. 2079-2088
◽
1974 ◽
Vol 32
◽
pp. 60-61
1977 ◽
Vol 35
◽
pp. 570-571
◽
1982 ◽
Vol 40
◽
pp. 598-599
1988 ◽
Vol 46
◽
pp. 362-363
1972 ◽
Vol 30
◽
pp. 464-465
1968 ◽
Vol 26
◽
pp. 326-327
1986 ◽
Vol 44
◽
pp. 316-317
1987 ◽
Vol 45
◽
pp. 578-581