Reflection high-energy electron diffraction studies of epitaxial oxide seed-layer growth on rolling-assisted biaxially textured substrate Ni(001): The role of surface structure and chemistry

2001 ◽  
Vol 79 (19) ◽  
pp. 3077-3079 ◽  
Author(s):  
C. Cantoni ◽  
D. K. Christen ◽  
R. Feenstra ◽  
A. Goyal ◽  
G. W. Ownby ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Surface Structure ◽  
Seed Layer ◽  
High Energy ◽  
Layer Growth ◽  
Energy Electron ◽  
High Energy Electron ◽  
Epitaxial Oxide

Reflection High Energy Electron Diffraction Studies of the Growth of DyBa2Cu3O7−x Films and Structures Grown on SrTiO3 Substrates

1992 ◽  
Vol 275 ◽  
Author(s):  
V. S. Achutharaman ◽  
N. Chandrasekhar ◽  
A. M. Goldman
Keyword(s):  
Electron Diffraction ◽  
Specular Reflection ◽  
Growth Conditions ◽  
High Energy ◽  
Layer Growth ◽  
Energy Electron ◽  
Layer By Layer ◽  
High Energy Electron ◽  
Epitaxial Relationship ◽  
Superlattice Structures

ABSTRACTIntensity oscillations of the specular reflection high energy electron diffraction (RHEED) beam contain useful information on the mode of growth and the evolving structure of thin films. We present RHEED studies of the growth of DyBa2Cu3O7−x films and DyBa2Cu3O7−x/DY2O3/DyBa2Cu3O7−x structures on SrTiO3; substrates deposited by ozone-assisted molecular beam epitaxy. The effect of substrate temperature, ozone flux and surface step densities on the epitaxial relationship and evolving microstructure will be discussed. The strong damping of the oscillations and identical time periods under different nuoleation and growth conditions suggest that the intensity oscillations are a consequence of to diffuse scattering from step edges rather than a layer-by-layer growth mode. It was also found that Dy2O3 can be used to fabricatee tri-layer type structures but not superlattice structures.

STRUCTURAL ANALYSIS OF CRYSTAL SURFACES BY REFLECTION HIGH ENERGY ELECTRON DIFFRACTION

1997 ◽  
Vol 04 (03) ◽  
pp. 501-511 ◽  
Author(s):  
AYAHIKO ICHIMIYA ◽  
YUSUKE OHNO ◽  
YOSHIMI HORIO
Keyword(s):  
Electron Diffraction ◽  
Surface Structure ◽  
Forward Direction ◽  
High Energy ◽  
Zone Axis ◽  
Energy Electron ◽  
High Energy Electron ◽  
Structure Determinations ◽  
The One ◽  
Diffraction Condition

For surface structure determinations by reflection high energy electron diffraction (RHEED), intensity rocking curves are analyzed through RHEED dynamical calculations. Since fast electrons are scattered dominantly in the forward direction by atoms, dynamic diffraction mainly occurs in the forward direction. By the use of this feature, it is possible to choose a diffraction condition under which electrons are diffracted mainly by lattice planes parallel to the surface, when the incident direction is chosen at a certain azimuthal angle with respect to a crystal zone axis. This diffraction condition is called the one-beam condition. Under this condition, the RHEED intensity is a function of interlayer distances and atomic densities of the surface layers. Therefore the surface normal components of the atomic positions are determined by analysis of the one-beam rocking curve using a RHEED dynamical calculation. Then, using the result of the surface normal components of atomic positions, lateral positions of the surface atoms are determined from analysis of the rocking curves at many-beam conditions, where the direction of the incident beam is chosen along a certain crystal zone axis. An example of the surface structure determination of a Si(111) surface at high temperatures is reported. We discuss effects of terraces and antiphase domains of surfaces in structure determinations by RHEED.

Sign in / Sign up

Export Citation Format

Share Document