Angle-resolved electron energy loss spectroscopy of valence-shell and Si 2p pre-edge excitation of SiF4: Bethe surface and absolute generalized oscillator strength measurement

2001 ◽  
Vol 115 (6) ◽  
pp. 2603-2613 ◽  
Author(s):  
X. W. Fan ◽  
K. T. Leung
Keyword(s):  
Energy Loss ◽  
Oscillator Strength ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Valence Shell ◽  
Strength Measurement ◽  
Generalized Oscillator ◽  
Electron Energy Loss

scholarly journals Electronic excitation and oscillator strength of ethyl iodide by VUV photoabsorption and electron energy loss spectroscopy

1999 ◽  
Vol 110 (21) ◽  
pp. 10307-10315 ◽  
Author(s):  
A. Giuliani ◽  
F. Motte-Tollet ◽  
J. Delwiche ◽  
J. Heinesch ◽  
N. J. Mason ◽  
...  
Keyword(s):  
Energy Loss ◽  
Oscillator Strength ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Electronic Excitation ◽  
Ethyl Iodide ◽  
Electron Energy Loss

Electronic and Chemical Analysis of a Metal-Insulator Interface Utilizing Transmission Electron Energy Loss Spectroscopy at 5Å Spatial Resolution

1984 ◽  
Vol 41 ◽  
Author(s):  
Michael Scheinfein ◽  
Michael Isaacson
Keyword(s):  
Chemical Analysis ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Valence Shell ◽  
Metal Insulator ◽  
Insulator Interface ◽  
Transmission Electron ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

AbstractUsing a 0.5 nm diameter probe of 100 keV electrons, we have been able to detect significant changes in the transmission electron energy loss spectra in the region of valence shell and L23 shell excitation within a spatial extent of 0.4 nm of an Al-AlF3 interface. The spectra have been recorded with a dose significantly less than the critical dose for destruction of the AlF3.

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