Conducting atomic force microscopy for nanoscale electrical characterization of thin SiO2

Alexander Olbrich; Bernd Ebersberger; Christian Boit

doi:10.1063/1.122690

Conducting atomic force microscopy for nanoscale electrical characterization of thin SiO2

Applied Physics Letters ◽

10.1063/1.122690 ◽

1998 ◽

Vol 73 (21) ◽

pp. 3114-3116 ◽

Cited By ~ 140

Author(s):

Alexander Olbrich ◽

Bernd Ebersberger ◽

Christian Boit

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Force Microscopy ◽

Atomic Force

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Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)

Ultramicroscopy ◽

10.1016/j.ultramic.2005.07.003 ◽

2006 ◽

Vol 106 (3) ◽

pp. 191-199 ◽

Cited By ~ 84

Author(s):

A. Alexeev ◽

J. Loos ◽

M.M. Koetse

Keyword(s):

Atomic Force Microscopy ◽

Polymer Blends ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Semiconducting Polymer ◽

Force Microscopy ◽

Atomic Force

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Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

Journal of the European Ceramic Society ◽

10.1016/j.jeurceramsoc.2010.01.005 ◽

2010 ◽

Vol 30 (7) ◽

pp. 1761-1764 ◽

Cited By ~ 10

Author(s):

Martin Schloffer ◽

Christian Teichert ◽

Peter Supancic ◽

Andrei Andreev ◽

Yue Hou ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/jp805422k ◽

2008 ◽

Vol 112 (49) ◽

pp. 19680-19685 ◽

Cited By ~ 14

Author(s):

Pavels Birjukovs ◽

Nikolay Petkov ◽

Ju Xu ◽

Janis Svirksts ◽

John J. Boland ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Nanowire Arrays ◽

Bismuth Sulfide ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Electrical characterization of oxygen-induced nanosized ripples on aluminum thin films by conductive atomic force microscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2005.07.245 ◽

2006 ◽

Vol 243 (1) ◽

pp. 16-19 ◽

Cited By ~ 12

Author(s):

P. Mishra ◽

P. Karmakar ◽

D. Ghose

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

Applied Physics Letters ◽

10.1063/1.1382624 ◽

2001 ◽

Vol 78 (26) ◽

pp. 4181-4183 ◽

Cited By ~ 40

Author(s):

M. Porti ◽

M. Nafrı́a ◽

X. Aymerich ◽

A. Olbrich ◽

B. Ebersberger

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Nanometer Scale ◽

Sio2 Films ◽

Force Microscopy ◽

Atomic Force

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Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Diamond and Related Materials ◽

10.1016/j.diamond.2005.11.052 ◽

2006 ◽

Vol 15 (4-8) ◽

pp. 618-621 ◽

Cited By ~ 5

Author(s):

F. Houzé ◽

J. Alvarez ◽

J.-P. Kleider ◽

P. Bergonzo ◽

E. Snidero ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Schottky Diodes ◽

Electrical Characterization ◽

Diamond Surfaces ◽

Force Microscopy ◽

Atomic Force

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Electrical characterization of HgTe nanowires using conductive atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.3512960 ◽

2010 ◽

Vol 108 (11) ◽

pp. 114308 ◽

Cited By ~ 3

Author(s):

P. Gundersen ◽

K. O. Kongshaug ◽

E. Selvig ◽

R. Haakenaasen

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Local electrical characterization of two-dimensional materials with functional atomic force microscopy

Frontiers of Physics ◽

10.1007/s11467-018-0879-7 ◽

2019 ◽

Vol 14 (3) ◽

Cited By ~ 14

Author(s):

Sabir Hussain ◽

Kunqi Xu ◽

Shili Ye ◽

Le Lei ◽

Xinmeng Liu ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Two Dimensional ◽

Force Microscopy ◽

Atomic Force ◽

Two Dimensional Materials

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Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

Materials Research Bulletin ◽

10.1016/j.materresbull.2015.05.002 ◽

2015 ◽

Vol 70 ◽

pp. 373-378 ◽

Cited By ~ 18

Author(s):

N. Muhunthan ◽

Om Pal Singh ◽

Vijaykumar Toutam ◽

V.N. Singh

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Grain Boundaries ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Czts Thin Films ◽

Microscopy Techniques

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Electrical Characterization of Silicon Tips Using Conducting Atomic Force Microscopy

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2005.207 ◽

2005 ◽

Vol 5 (8) ◽

pp. 1277-1280 ◽

Cited By ~ 1

Author(s):

Xinxing Xiao ◽

Zhongdang Xiao ◽

Zuhong Lu

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Force Microscopy ◽

Atomic Force

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