Direct measurement of sub-10 nm-level lateral distribution in tunneling-electron luminescence intensity on a cross-sectional 50-nm-thick AlAs layer by using a conductive transparent tip
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2014 ◽
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2017 ◽
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2015 ◽
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Vol 32
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pp. 221-227
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2010 ◽
Vol 49
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pp. 1107-1121
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