Atomic-scale defect control on hydrogen-terminated silicon surface at wafer scale

2001 ◽  
Vol 78 (3) ◽  
pp. 309-311 ◽  
Author(s):  
Hiroyuki Sakaue ◽  
Shinya Fujiwara ◽  
Shoso Shingubara ◽  
Takayuki Takahagi
Keyword(s):  
Silicon Surface ◽  
Atomic Scale ◽  
Wafer Scale ◽  
Defect Control

scholarly journals Atomic scale memory at a silicon surface

2002 ◽  
Vol 13 (4) ◽  
pp. 499-502 ◽  
Author(s):  
R Bennewitz ◽  
J N Crain ◽  
A Kirakosian ◽  
J-L Lin ◽  
J L McChesney ◽  
...  
Keyword(s):  
Silicon Surface ◽  
Atomic Scale

Effects of atomic-scale surface morphology on carbon nanotube alignment on thermally oxidized silicon surface

2010 ◽  
Vol 96 (10) ◽  
pp. 103102 ◽  
Author(s):  
Kazuki Yamada ◽  
Shohei Chiashi ◽  
Katsuhiro Takahashi ◽  
Yoshikazu Homma
Keyword(s):  
Carbon Nanotube ◽  
Surface Morphology ◽  
Silicon Surface ◽  
Atomic Scale ◽  
Scale Surface

scholarly journals Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control

2017 ◽  
Vol 29 (11) ◽  
pp. 4700-4707 ◽  
Author(s):  
Wei-Hsiang Lin ◽  
Victor W. Brar ◽  
Deep Jariwala ◽  
Michelle C. Sherrott ◽  
Wei-Shiuan Tseng ◽  
...  
Keyword(s):  
Boron Nitride ◽  
Hexagonal Boron Nitride ◽  
Chemical Characterization ◽  
Atomic Scale ◽  
Thickness Control ◽  
Wafer Scale ◽  
Nitride Layers

scholarly journals Theory of atomic scale quantum dots in silicon: Dangling bond quantum dots on silicon surface

2020 ◽  
Vol 305 ◽  
pp. 113752
Author(s):  
Alain Delgado ◽  
Marek Korkusinski ◽  
Pawel Hawrylak
Keyword(s):  
Quantum Dots ◽  
Silicon Surface ◽  
Atomic Scale ◽  
Dangling Bond

Atomic Scale Oxidation Process on Hydrogen-Terminated Silicon Surface

1996 ◽  
Author(s):  
Hiroshi NOHIRA ◽  
Yohichi OKUBE ◽  
Etsuo IIJIMA ◽  
Hiroshi YAMAMOTO ◽  
Naoto TATE ◽  
...  
Keyword(s):  
Silicon Surface ◽  
Oxidation Process ◽  
Atomic Scale
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