scholarly journals Analysis of simulated scanning of atomic-scale silicon surface by atomic force microscopy

Scanning ◽  
2008 ◽  
Vol 30 (5) ◽  
pp. 392-404
Author(s):  
Zone-Ching Lin ◽  
Shih-Che Liu
Keyword(s):  
Atomic Force Microscopy ◽  
Silicon Surface ◽  
Atomic Scale ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy of Atomic-Scale Ledges and Etch Pits Formed During Dissolution of Quartz

Science ◽  
1991 ◽  
Vol 251 (4999) ◽  
pp. 1343-1346 ◽  
Author(s):  
A. J. GRATZ ◽  
S. MANNE ◽  
P. K. HANSMA
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Scale ◽  
Etch Pits ◽  
Force Microscopy ◽  
Atomic Force

Nanoindentation studies of sublimed fullerene films using atomic force microscopy

1993 ◽  
Vol 8 (12) ◽  
pp. 3019-3022 ◽  
Author(s):  
Juai Ruan ◽  
Bharat Bhushan
Keyword(s):  
Atomic Force Microscopy ◽  
Transfer Film ◽  
Atomic Scale ◽  
Diamond Surface ◽  
Low Friction ◽  
Force Microscopy ◽  
Diamond Sample ◽  
Atomic Force ◽  
Molecular Scale ◽  
Deposited Films

Nanoindentation studies of sublimed fullerene films have been conducted using an atomic force microscope (AFM). Transfer of fullerene molecules from the as-deposited films to the AFM tip was observed during the indentation of AFM tip into some of the samples, whereas such a transfer was not observed for ion-bombarded films. The fullerene molecules transferred to the AFM tip were subsequently transported to a diamond surface when the diamond sample was scanned with the contaminated tip. This demonstrates the capability of material manipulation on a molecular scale using AFM. Atomic-scale friction of the fullerene films was measured to be low. Ability of fullerene films to form transfer film on the mating AFM tip surface may be partly responsible for low friction.

Direct observations of mineral fluid reactions using atomic force microscopy: the specific example of calcite

2012 ◽  
Vol 76 (1) ◽  
pp. 227-253 ◽  
Author(s):  
E. Ruiz -Agudo ◽  
C. V. Putnis
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Scale ◽  
Physical Parameters ◽  
Extensive Literature ◽  
Mineral Surfaces ◽  
Kinetic Measurements ◽  
Force Microscopy ◽  
Crystal Dissolution ◽  
Direct Observations ◽  
Atomic Force

AbstractAtomic force microscopy (AFM) enables in situ observations of mineral fluid reactions to be made at a nanoscale. During the past 20 years, the direct observation of mineral surfaces at molecular resolution during dissolution and growth has made significant contributions toward improvements in our understanding of the dynamics of mineral fluid reactions at the atomic scale. Observations and kinetic measurements of dissolution and growth from AFM experiments give valuable evidence for crystal dissolution and growth mechanisms, either confirming existing models or revealing their limitations. Modifications to theories can be made in the light of experimental evidence generated by AFM. Significant changes in the kinetics and mechanisms of crystallization and dissolution processes occur when the chemical and physical parameters of solutions, including the presence of impurity molecules or background electrolytes, are altered. Calcite has received considerable attention in AFM studies due to its central role in geochemical and biomineralization processes. This review summarizes the extensive literature on the dissolution and growth of calcite that has been generated by AFM studies, including the influence of fluid characteristics such as supersaturation, solution stoichiometry, pH, temperature and the presence of impurities.

scholarly journals Nanopatterning on silicon surface using atomic force microscopy with diamond-like carbon (DLC)-coated Si probe

2011 ◽  
Vol 6 (1) ◽  
pp. 518 ◽  
Author(s):  
Xiaohong Jiang ◽  
Guoyun Wu ◽  
Jingfang Zhou ◽  
Shujie Wang ◽  
Ampere A Tseng ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Silicon Surface ◽  
Diamond Like Carbon ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Atomic Resolution with the Atomic Force Microscope

1995 ◽  
Vol 3 (4) ◽  
pp. 6-7
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Atomic Force Microscope ◽  
Recent Article ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force

For biologic studies, atomic force microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM) because it has the capability of imaging non-conducting biologic specimens. However, STM generally gives better resolution than AFM, and we're talking about resolution on the atomic scale. In a recent article, Franz Giessibl (Atomic resolution of the silicon (111)- (7X7) surface by atomic force microscopy, Science 267:68-71, 1995) has demonstrated that atoms can be imaged by AFM.

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