Atomic force microscopy study of plastic deformation and interfacial sliding in Al thin film: Si substrate systems due to thermal cycling

M. W. Chen; I. Dutta

doi:10.1063/1.1332098

Atomic force microscopy study of plastic deformation and interfacial sliding in Al thin film: Si substrate systems due to thermal cycling

Applied Physics Letters ◽

10.1063/1.1332098 ◽

2000 ◽

Vol 77 (26) ◽

pp. 4298-4300 ◽

Cited By ~ 22

Author(s):

M. W. Chen ◽

I. Dutta

Keyword(s):

Thin Film ◽

Plastic Deformation ◽

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Si Substrate ◽

Force Microscopy ◽

Interfacial Sliding ◽

Atomic Force ◽

Al Thin Film

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Inside Front Cover: Oxidation Conditions for Octadecyl Trichlorosilane Monolayers on Silicon: A Detailed Atomic Force Microscopy Study of the Effects of Pulse Height and Duration on the Oxidation of the Monolayer and the Underlying Si Substrate (Adv. Funct. Mater. 6/2005)

Advanced Functional Materials ◽

10.1002/adfm.200590021 ◽

2005 ◽

Vol 15 (6) ◽

pp. NA-NA

Author(s):

D. Wouters ◽

R. Willems ◽

S. Hoeppener ◽

C. F. J. Flipse ◽

U. S. Schubert

Keyword(s):

Atomic Force Microscopy ◽

Pulse Height ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Si Substrate ◽

Front Cover ◽

Force Microscopy ◽

Atomic Force ◽

Octadecyl Trichlorosilane

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Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyanoquinodimethane thin film grown by vacuum evaporation

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1459723 ◽

2002 ◽

Vol 20 (2) ◽

pp. 673 ◽

Cited By ~ 3

Author(s):

J. C. Li ◽

W. M. Liu ◽

Z. Q. Xue

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Pattern Formation ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron

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Errata: “Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyano- quinodimethane thin film grown by vacuum evaporation” [J. Vac. Sci. Technol. B 20, 673 (2002)]

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1740769 ◽

2004 ◽

Vol 22 (3) ◽

pp. 1213

Author(s):

J. C. Li ◽

W. M. Liu ◽

Z. Q. Xue

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Pattern Formation ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron

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Growth instability and surface phase transition of Ti thin film on Si(111): An atomic force microscopy study

Applied Surface Science ◽

10.1016/j.apsusc.2005.07.026 ◽

2006 ◽

Vol 252 (18) ◽

pp. 6135-6140 ◽

Cited By ~ 4

Author(s):

Deeder Aurongzeb

Keyword(s):

Thin Film ◽

Phase Transition ◽

Atomic Force Microscopy ◽

Microscopy Study ◽

Surface Phase ◽

Atomic Force Microscopy Study ◽

Surface Phase Transition ◽

Force Microscopy ◽

Atomic Force

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Photoelectron spectroscopy and atomic force microscopy study of 1,2-dicyano-methanofullerene C60(CN)2 thin film for photovoltaic applications

Solar Energy Materials and Solar Cells ◽

10.1016/j.solmat.2010.12.024 ◽

2011 ◽

Vol 95 (4) ◽

pp. 1111-1118 ◽

Cited By ~ 5

Author(s):

Vaishali Rao Koppolu ◽

Mool C. Gupta ◽

Louis Scudiero

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Photoelectron Spectroscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Photovoltaic Applications

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A conducting atomic force microscopy study of conducting filament nanobits in the epitaxial NiO thin film prepared precisely controlled by the oxidation time of the single crystalline Ni substrates

Ultramicroscopy ◽

10.1016/j.ultramic.2019.05.009 ◽

2019 ◽

Vol 205 ◽

pp. 57-61

Author(s):

Hyun Wook Shin ◽

Jong Yeog Son

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Microscopy Study ◽

Oxidation Time ◽

Atomic Force Microscopy Study ◽

Single Crystalline ◽

Conducting Filament ◽

Force Microscopy ◽

Atomic Force ◽

Nio Thin Film

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Atomic Force Microscopy Study of the Polymeric Nanotemplate Fabricated via a Microphase Separation and Subsequent Selective Etching of (PS-b-PI) Copolymer Thin Film

Japanese Journal of Applied Physics ◽

10.1143/jjap.43.762 ◽

2004 ◽

Vol 43 (2) ◽

pp. 762-766

Author(s):

Jonghyurk Park ◽

Jeong Sook Ha ◽

Jinsook Ryu ◽

Taihyun Chang

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Microphase Separation ◽

Microscopy Study ◽

Selective Etching ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Atomic force microscopy study of the morphological shape of thin film buckling

Thin Solid Films ◽

10.1016/s0040-6090(01)01772-2 ◽

2002 ◽

Vol 406 (1-2) ◽

pp. 190-194 ◽

Cited By ~ 40

Author(s):

C. Coupeau

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Thin film semiconductor nanomaterials and nanostructures prepared by physical vapour deposition: An atomic force microscopy study

Journal of Physics and Chemistry of Solids ◽

10.1016/j.jpcs.2007.02.025 ◽

2007 ◽

Vol 68 (5-6) ◽

pp. 675-680 ◽

Cited By ~ 6

Author(s):

D. Nesheva ◽

A. Petrova ◽

S. Stavrev ◽

Z. Levi ◽

Z. Aneva

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Vapour Deposition ◽

Microscopy Study ◽

Physical Vapour Deposition ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Semiconductor Nanomaterials

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Conductive Atomic Force Microscopy Study of Doped Tin Oxide Thin Film

Microscopy and Microanalysis ◽

10.1017/s1431927610053511 ◽

2010 ◽

Vol 16 (S2) ◽

pp. 1562-1563

Author(s):

L Fang ◽

R Korotkov

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Tin Oxide ◽

Microscopy Study ◽

Oxide Thin Film ◽

Atomic Force Microscopy Study ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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