Cross-sectional electrostatic force microscopy of thin-film solar cells

2001 ◽  
Vol 89 (2) ◽  
pp. 1418-1424 ◽  
Author(s):  
C. Ballif ◽  
H. R. Moutinho ◽  
M. M. Al-Jassim
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Electrostatic Force ◽  
Thin Film Solar Cells ◽  
Electrostatic Force Microscopy ◽  
Cross Sectional ◽  
Force Microscopy

scholarly journals Imaging Charge Transfer State Excitations in Polymer/Fullerene Solar Cells with Time-Resolved Electrostatic Force Microscopy

2015 ◽  
Vol 6 (15) ◽  
pp. 2852-2858 ◽  
Author(s):  
Phillip A. Cox ◽  
Micah S. Glaz ◽  
Jeffrey S. Harrison ◽  
Samuel R. Peurifoy ◽  
David C. Coffey ◽  
...  
Keyword(s):  
Solar Cells ◽  
Charge Transfer ◽  
Electrostatic Force ◽  
Charge Transfer State ◽  
Electrostatic Force Microscopy ◽  
Time Resolved ◽  
Force Microscopy ◽  
Transfer State

NEW MATERIALS USED AS OPTICAL WINDOW IN THIN FILM SOLAR CELLS

2002 ◽  
Vol 09 (05n06) ◽  
pp. 1675-1680 ◽  
Author(s):  
G. GORDILLO
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Thin Film Solar Cells ◽  
Morphological Properties ◽  
New Materials ◽  
Optical Window ◽  
Force Microscopy ◽  
Atomic Force ◽  
Window Systems ◽  
Materials Used

The purpose of this work is to investigate new materials which present good properties to be used as optical window and buffer layer in thin film solar cells based on CdTe and CuInSe 2. As potential candidates for optical windows, two different bilayer systems were studied: ZnO/In x Se y and ZnO/ZnSe. They are planned to be used later in the fabrication of solar cells with structures CuInSe 2/ In x Se y/ ZnO and ZnO/ZnSe/CdTe. The methods used to prepare the different window materials, as well as the technological stages of the solar cell fabrication, will be described. Additionally, the optical and morphological properties of the window systems will be studied through transmittance and atomic force microscopy (AFM) measurements. Preliminary results obtained with Cu(In,Ga)Se 2 solar cells, fabricated using ZnO/In x Se y as optical window, will be reported. They will be compared with those obtained using ZnO/CdS as optical window, which is regularly used in this type of cells.

Analysis of untreated cross sections of Cu(In,Ga)Se2 thin-film solar cells with varying Ga content using Kelvin probe force microscopy

2011 ◽  
Vol 99 (4) ◽  
pp. 042111 ◽  
Author(s):  
Zhenhao Zhang ◽  
Xiaochen Tang ◽  
Uli Lemmer ◽  
Wolfram Witte ◽  
Oliver Kiowski ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Cross Sections ◽  
Kelvin Probe Force Microscopy ◽  
Thin Film Solar Cells ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Ga Content

Cross-sectional electrostatic force microscopy of semiconductor laser diodes

2001 ◽  
Vol 35 (7) ◽  
pp. 840-846 ◽  
Author(s):  
A. V. Ankudinov ◽  
E. Yu. Kotel’nikov ◽  
A. A. Kantsel’son ◽  
V. P. Evtikhiev ◽  
A. N. Titkov
Keyword(s):  
Semiconductor Laser ◽  
Electrostatic Force ◽  
Laser Diodes ◽  
Electrostatic Force Microscopy ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Semiconductor Laser Diodes
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