Near edge x-ray absorption fine structure of thermally annealed amorphous nitrogenated carbon films

2000 ◽  
Vol 88 (9) ◽  
pp. 5043-5049 ◽  
Author(s):  
Somnath Bhattacharyya ◽  
M. Lübbe ◽  
F. Richter
Keyword(s):  
Fine Structure ◽  
Carbon Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Nitrogenated Carbon

scholarly journals Study of Synchrotron Radiation Near-Edge X-Ray Absorption Fine-Structure of Amorphous Hydrogenated Carbon Films at Various Thicknesses

2015 ◽  
Vol 2015 ◽  
pp. 1-7 ◽  
Author(s):  
Sarayut Tunmee ◽  
Ratchadaporn Supruangnet ◽  
Hideki Nakajima ◽  
XiaoLong Zhou ◽  
Satoru Arakawa ◽  
...  
Keyword(s):  
Fine Structure ◽  
Film Thickness ◽  
Rutherford Backscattering Spectrometry ◽  
Carbon Films ◽  
Elastic Recoil ◽  
X Ray ◽  
Absorption Fine ◽  
Detection Analysis ◽  
X Ray Absorption ◽  
Amorphous Hydrogenated Carbon

The compositions and bonding states of the amorphous hydrogenated carbon films at various thicknesses were evaluated via near-edge X-ray absorption fine-structure (NEXAFS) and elastic recoil detection analysis combined with Rutherford backscattering spectrometry. The absolute carbonsp2contents were determined to decrease to 65% from 73%, while the hydrogen contents increase from 26 to 33 at.% as the film thickness increases. In addition, as the film thickness increases, theπ⁎(C=C),σ⁎(C–H),σ⁎(C=C), andσ⁎(C≡C) bonding states were found to increase, whereas theπ⁎(C≡C) andσ⁎(C–C) bonding states were observed to decrease in the NEXAFS spectra. Consequently, the film thickness is a key factor to evaluate the composition and bonding state of the films.

Near-edge x-ray absorption fine structure and Raman characterization of amorphous and nanostructured carbon films

1999 ◽  
Vol 85 (10) ◽  
pp. 7159-7167 ◽  
Author(s):  
C. Lenardi ◽  
P. Piseri ◽  
V. Briois ◽  
C. E. Bottani ◽  
A. Li Bassi ◽  
...  
Keyword(s):  
Fine Structure ◽  
Carbon Films ◽  
Nanostructured Carbon ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Raman Characterization

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Kinetic analysis of Ag particle redispersion into ZSM-5 in the presence of coke using in situ XAFS

2021 ◽  
Author(s):  
Kazumasa Murata ◽  
Junya Ohyama ◽  
Atsushi Satsuma
Keyword(s):  
Fine Structure ◽  
Kinetic Analysis ◽  
X Ray ◽  
Xafs Spectroscopy ◽  
Absorption Fine ◽  
Ag Particles ◽  
In Situ Xafs ◽  
Ag Particle ◽  
X Ray Absorption

In the present study, the redispersion behavior of Ag particles on ZSM-5 in the presence of coke was observed using in situ X-ray absorption fine structure (XAFS) spectroscopy.

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