Determination of bonding structure of Si, Ge, and N incorporated amorphous carbon films by near-edge x-ray absorption fine structure and ultraviolet Raman spectroscopy

2004 ◽  
Vol 96 (2) ◽  
pp. 1013-1018 ◽  
Author(s):  
Hae-Suk Jung ◽  
Hyung-Ho Park ◽  
I. R. Mendieta ◽  
D. A. Smith
1999 ◽  
Vol 354 (1-2) ◽  
pp. 106-110 ◽  
Author(s):  
Matthias Ramm ◽  
Masafumi Ata ◽  
Klaus-Werner Brzezinka ◽  
Thomas Gross ◽  
Wolfgang Unger

2005 ◽  
Vol 21 (7) ◽  
pp. 769-773 ◽  
Author(s):  
Masaki TAKAOKA ◽  
Satoshi FUKUTANI ◽  
Takashi YAMAMOTO ◽  
Masato HORIUCHI ◽  
Naoya SATTA ◽  
...  

1975 ◽  
Vol 11 (12) ◽  
pp. 4836-4846 ◽  
Author(s):  
E. A. Stern ◽  
D. E. Sayers ◽  
F. W. Lytle

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