Study on the Surface Density of Surface-Active Substances through Total-Reflection X-ray Absorption Fine Structure Measurement

Langmuir ◽  
2006 ◽  
Vol 22 (20) ◽  
pp. 8403-8408 ◽  
Author(s):  
Kaoru Kashimoto ◽  
Youichi Takata ◽  
Takashi Matsuda ◽  
Norihiro Ikeda ◽  
Hiroki Matsubara ◽  
...  
Keyword(s):  
Fine Structure ◽  
Surface Density ◽  
Total Reflection ◽  
X Ray ◽  
Absorption Fine ◽  
Surface Active ◽  
X Ray Absorption ◽  
Structure Measurement ◽  
Active Substances

X–ray absorption fine structure (XAFS) of Si wafer measured using total reflection X–rays

1999 ◽  
Vol 54 (1) ◽  
pp. 215-222 ◽  
Author(s):  
Jun Kawai ◽  
Shinjiro Hayakawa ◽  
Yoshinori Kitajima ◽  
Yohichi Gohshi
Keyword(s):  
Fine Structure ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Si Wafer

Thiophene adsorption on Pd(111) and Pd(100) surfaces studied by total-reflection S K-edge X-ray absorption fine-structure spectroscopy

1998 ◽  
Vol 414 (1-2) ◽  
pp. 107-117 ◽  
Author(s):  
S. Terada ◽  
T. Yokoyama ◽  
M. Sakano ◽  
A. Imanishi ◽  
Y. Kitajima ◽  
...  
Keyword(s):  
Fine Structure ◽  
Total Reflection ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Bent crystal Laue analyser combined with total reflection fluorescence X-ray absorption fine structure (BCLA + TRF-XAFS) and its application to surface studies

2020 ◽  
Vol 27 (6) ◽  
pp. 1618-1625
Author(s):  
Yuki Wakisaka ◽  
Bing Hu ◽  
Daiki Kido ◽  
Md. Harun Al Rashid ◽  
Wenhan Chen ◽  
...  
Keyword(s):  
Fine Structure ◽  
Sudden Change ◽  
Fluorescence Emission ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Xafs Spectroscopy ◽  
Bent Crystal ◽  
Absorption Fine ◽  
X Ray Absorption

A bent crystal Laue analyser (BCLA) is an X-ray energy analyser used for fluorescence X-ray absorption fine-structure (XAFS) spectroscopy to separate the fluorescence X-ray emission line of a target atom from the elastic scattering X-rays and other fluorescence emission lines. Here, the feasibility of the BCLA for total reflection fluorescence XAFS (TRF-XAFS), which has a long X-ray footprint on the substrate surface owing to grazing incidence, was tested. The focal line of the BCLA was adjusted on the X-ray footprint and the XAFS signal for one monolayer of Pt deposited on a 60 nm Au film with high sensitivity was obtained. Although range-extended XAFS was expected by the rejection of Au fluorescence arising from the Au substrate, a small glitch was found in the Au L 3 edge because of the sudden change of the complex refraction index of the Au substrate at the Au edge. This abnormal spectrum feature can be removed by reflectivity correction using Au foil absorption data. BCLA combined with TRF-XAFS spectroscopy (BCLA + TRF-XAFS) is a new technique for the in situ surface analysis of highly dispersed systems even in the presence of a liquid overlayer.

Polarized Total-Reflection X-ray Absorption Fine Structure of Zinc(II) Porphyrin at the Heptane−Water Interface

2010 ◽  
Vol 114 (43) ◽  
pp. 18583-18587 ◽  
Author(s):  
Hirohisa Nagatani ◽  
Hajime Tanida ◽  
Makoto Harada ◽  
Maki Asada ◽  
Takamasa Sagara
Keyword(s):  
Fine Structure ◽  
Total Reflection ◽  
Water Interface ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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