High-resolution microbeam x-ray diffractometry applied to InGaAsP/InP layers grown by narrow-stripe selective metal-organic vapor phase epitaxy

2000 ◽  
Vol 77 (9) ◽  
pp. 1286-1288 ◽  
Author(s):  
Shigeru Kimura ◽  
Hidekazu Kimura ◽  
Kenji Kobayashi ◽  
Tomoaki Oohira ◽  
Koich Izumi ◽  
...  
2017 ◽  
Vol 88 (3) ◽  
pp. 035113 ◽  
Author(s):  
Guangxu Ju ◽  
Matthew J. Highland ◽  
Angel Yanguas-Gil ◽  
Carol Thompson ◽  
Jeffrey A. Eastman ◽  
...  

2014 ◽  
Vol 105 (5) ◽  
pp. 051602 ◽  
Author(s):  
Edith Perret ◽  
M. J. Highland ◽  
G. B. Stephenson ◽  
S. K. Streiffer ◽  
P. Zapol ◽  
...  

2008 ◽  
Vol 1 ◽  
pp. 071102 ◽  
Author(s):  
Tomonari Shioda ◽  
Masakazu Sugiyama ◽  
Yukihiro Shimogaki ◽  
Yoshiaki Nakano

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